ZSLS7031 Datasheet

© 2016 Integrated Device Technology, Inc.

6

January 26, 2016

1.3

Electrical Parameters

Ω, and T

Production testing of the chip is performed at 25°C unless otherwise stated. Functional operation of the chip and

specified parameters at other temperatures are guaranteed by design, characterization, and process control.

Table 1.3

Electrical Parameters

No.

PARAMETER

SYMBOL

CONDITIONS

MIN

TYP

MAX

UNIT

1.3.1

VCC startup voltage threshold

VCC rising

14.5

16

17.5

V

1.3.2

VCC under-voltage threshold

VCC falling

7

8

9

V

1.3.3

GATE output voltage clamp

value

VCC rising to 22V

15

17.5

19

V

1.3.4

Quiescent Supply Current

Not switching

800

μA

1.3.5

Startup current

VCC < Vth_s

60

80

μA

1.3.6

Primary peak current control

threshold voltage

0.49

0.5

0.51

V

1.3.7

Blanking time

500

800

ns

1.3.8

Rise time

0V to 7V, 1nF capacitor

from GATE to GND

100

120

ns

1.3.9

Fall time

from GATE to GND

50

80

ns

1.3.10

OVP rising voltage threshold

of FB

1.2

1.25

1.3

V

1.3.11

OVP falling voltage threshold

of FB

0.95

1.0

1.05

V

1.3.12

Operating frequency

f

Ω

49

50

51

kHz

1.3.13

CS over-current protection

delay

f = 50 kHz

500

600

750

μs

1.3.14

CS over-current protection

threshold

f = 50 kHz

0.65

0.70

0.75

V