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PCA9512DP 数据表(PDF) 10 Page - NXP Semiconductors |
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PCA9512DP 数据表(HTML) 10 Page - NXP Semiconductors |
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10 / 16 page ![]() Philips Semiconductors Product data sheet PCA9512 Level shifting hot swappable I2C and SMBus buffer 2004 Oct 05 10 ELECTRICAL CHARACTERISTICS VCC = 2.7 V to 5.5 V; Tamb = –40 °C to +85 °C unless otherwise noted. SYMBOL PARAMETER TEST CONDITIONS LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONS MIN. TYP. MAX. UNIT Power supply VCC Supply voltage Note 1. 2.7 — 5.5 V VCC2 Card side supply voltage Note 1. 2.7 — 5.5 V IVCCI VCC supply current VCC = 5.5 V; VSDAIN = VSCLIN = 0 V — 1.2 3.6 mA IVCC2 VCC supply current VCC = 5.5 V; VSDAOUT = VSCLOUT = 0 V — 1.1 2.4 mA Start-up circuitry VPRE Precharge voltage SDA, SCL floating; Note 1. 0.8 1.1 1.2 V tEN Enable time on power-up Note 6. — 180 — µs tIDLE Bus idle time Notes 1 and 7. 50 140 250 µs Rise time accelerators IPULLUPAC Transient boosted pull-up current Positive transition on SDA, SCL, ACC = 0.7 V × VCC2; VCC = 2.7 V; Slew rate = 1.25 V/ µs; Note 2. 1 2 — mA VACCDIS Accelerator disable threshold 0.3 × VCC2 0.5 × VCC2 — V VACCEN Accelerator enable threshold — 0.5 × VCC2 0.7 × VCC2 V IVACC ACC input current –1 ± 0.1 1 µA tPDOFF ACC delay, on/off — 5 — ns Input–output connection VOS Input–output offset voltage 10 k Ω to VCC on SDA, SCL; VCC = 3.3 V, VCC2 = 3.3 V; VIN = 0.2 V; Note 1; Note 3. 0 70 150 mV fSCL_SDA operating frequency Guaranteed by design, not subject to test 0 — 400 kHz CIN Digital input capacitance Guaranteed by design, not subject to test — — 10 pF VOL LOW-level output voltage Input = 0 V. SDA, SCL pins; ISINK = 3 mA; VCC = 2.7 V; VCC2 = 2.7 V; Note 1. 0 — 0.4 V ILI Input leakage current SDA, SCL pins = VCC = 5.5 V; VCC2 = 5.5 V –1 — 5 µA Timing characteristics fI2C I2C operating frequency Note 4 0 — 400 kHz tBUF Bus free time between stop and start condition Note 4 1.3 — — µs tHD;STA Hold time after (repeated) start condition Note 4 0.6 — — µs tSU;STA Repeated start condition setup time Note 4 0.6 — — µs tSU;STO Stop condition setup time Note 4 0.6 — — µs tHD;DAT Data hold time Note 4 300 — — ns tSU;DAT Data setup time Note 4 100 — — ns tLOW Clock LOW period Note 4 1.3 — — µs tHIGH Clock HIGH period Note 4 0.6 — — µs tf Clock, data fall time Notes 4 and 5 20 + 0.1 × CB — 300 ns tr Clock, data rise time Notes 4 and 5 20 + 0.1 × CB — 300 ns NOTES: 1. This specification applies over the full operating temperature range. 2. IPULLUPAC varies with temperature and VCC voltage, as shown in the Typical Performance Characteristics section. |
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