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STD45P4LLFAG 数据表(PDF) 5 Page - STMicroelectronics |
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STD45P4LLFAG 数据表(HTML) 5 Page - STMicroelectronics |
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5 / 16 page ![]() STD45P4LLF6AG Electrical characteristics DocID027807 Rev 2 5/16 Table 7: Source-drain diode Symbol Parameter Test conditions Min. Typ. Max. Unit ISD Source-drain current - -50 A ISDM(1) Source-drain current (pulsed) - -200 A VSD(2) Forward on voltage VGS = 0 V, ISD = -50 A - -1.3 V trr Reverse recovery time ISD = -50 A, di/dt = -100 A/µs, VDD = -32 V (see Figure 15: "Test circuit for inductive load switching and diode recovery times") - 27.5 ns Qrr Reverse recovery charge - 24.5 nC IRRM Reverse recovery current - -1.8 A Notes: (1) Pulse width is limited by safe operating area. (2) Pulse test: pulse duration = 300 µs, duty cycle 1.5%. |
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