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SPC560B60x 数据表(PDF) 87 Page - STMicroelectronics |
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SPC560B60x 数据表(HTML) 87 Page - STMicroelectronics |
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87 / 133 page ![]() DocID15131 Rev 9 87/133 SPC560B54x/6x Electrical characteristics 132 Therefore it is recommended that the user apply EMC software optimization and prequalification tests in relation with the EMC level requested for the application. Software recommendations The software flowchart must include the management of runaway conditions such as: – Corrupted program counter – Unexpected reset – Critical data corruption (control registers...) Prequalification trials Most of the common failures (unexpected reset and program counter corruption) can be reproduced by manually forcing a low state on the reset pin or the oscillator pins for 1 second. To complete these trials, ESD stress can be applied directly on the device. When unexpected behavior is detected, the software can be hardened to prevent unrecoverable errors occurring (see application note Software Techniques For Improving Microcontroller EMC Performance (AN1015)). 4.11.2 Electromagnetic interference (EMI) The product is monitored in terms of emission based on a typical application. This emission test conforms to the IEC61967-1 standard, which specifies the general conditions for EMI measurements. 4.11.3 Absolute maximum ratings (electrical sensitivity) Based on two different tests (ESD and LU) using specific measurement methods, the product is stressed in order to determine its performance in terms of electrical sensitivity. Table 34. EMI radiated emission measurement(1)(2) Symbol C Parameter Conditions Value Unit Min Typ Max — SR — Scan range — 0.15 0 1000 MHz fCPU SR — Operating frequency — — 64 — MHz VDD_LV SR — LV operating voltages —— 1.28 — V SEMI CC T Peak level VDD = 5 V, TA = 25 °C, LQFP144 package Test conforming to IEC 61967-2, fOSC = 8 MHz/fCPU = 64 MHz No PLL frequency modulation —— 18 dBµ V ± 2% PLL frequency modulation —— 14 dBµ V 1. EMI testing and I/O port waveforms per IEC 61967-1, -2, -4. 2. For information on conducted emission and susceptibility measurement (norm IEC 61967-4), please contact your local marketing representative. |
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