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STM32F070CB 数据表(PDF) 41 Page - STMicroelectronics |
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STM32F070CB 数据表(HTML) 41 Page - STMicroelectronics |
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41 / 83 page ![]() DocID027114 Rev 3 41/83 STM32F070CB/RB/C6/F6 Electrical characteristics 69 6.3.4 Embedded reference voltage The parameters given in Table 23 are derived from tests performed under the ambient temperature and supply voltage conditions summarized in Table 20: General operating conditions. 6.3.5 Supply current characteristics The current consumption is a function of several parameters and factors such as the operating voltage, ambient temperature, I/O pin loading, device software configuration, operating frequencies, I/O pin switching rate, program location in memory and executed binary code. The current consumption is measured as described in Figure 10: Current consumption measurement scheme. All Run-mode current consumption measurements given in this section are performed with a reduced code that gives a consumption equivalent to CoreMark code. VPDRhyst PDR hysteresis - - 40 - mV tRSTTEMPO(4) Reset temporization - 1.50 2.50 4.50 ms 1. The PDR detector monitors VDD and also VDDA (if kept enabled in the option bytes). The POR detector monitors only VDD. 2. The product behavior is guaranteed by design down to the minimum VPOR/PDR value. 3. Data based on characterization results, not tested in production. 4. Guaranteed by design, not tested in production. Table 22. Embedded reset and power control block characteristics (continued) Symbol Parameter Conditions Min Typ Max Unit Table 23. Embedded internal reference voltage Symbol Parameter Conditions Min Typ Max Unit VREFINT Internal reference voltage -40°C < TA < +85°C 1.2 1.23 1.25 V tSTART ADC_IN17 buffer startup time -- - 10(1) µs tS_vrefint ADC sampling time when reading the internal reference voltage - 4 (1) -- µs ΔVREFINT Internal reference voltage spread over the temperature range VDDA = 3 V - - 10(1) 1. Guaranteed by design, not tested in production. mV TCoeff Temperature coefficient - -100(1) - 100(1) ppm/°C |
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