TP3076 datasheet(17/18 Pages) NSC

17 / 18 page

Transmission Characteristics (Continued)

Unless otherwise noted, limits printed in BOLD characters are guaranteed for V

CC = +5V ±5%,VBB = −5V ±5%;TA = 0˚C to

+70˚C by correlation with 100% electrical testing at T

A = 25˚C. f = 1015.625 Hz, VFXI = 0 dBm0, DR1 = 0 dBm0 PCM code.

Transmit and receive gains programmed for maximum 0 dBm0 test levels (0 dB Gain). All other limits are assured by correla-

tion with other production tests and/or product design and characterization. All signals referenced to GND. Typicals specified

at V

CC = +5V, VBB = −5V, TA = 25˚C.

Symbol

Parameter

Conditions

Min

Typ

Max

Units

NOISE

SOS

Spurous Out-of-Band

0 dBm0 300 Hz to 3400 Hz Input PCM Code

Signals Applied at the

at D

Channel Output

4600 Hz–7600 Hz

−30

7600 Hz–8400 Hz

−40

8400 Hz–50,000 Hz

−30

DISTORTION

STD

Signal to Total Distortion

Sinusoidal Test Method

STD

Transmit or Receive

Level = 3.0 dBm0

dBC

Half-Channel, µ-Law

= 0 dBm0 to −30 dBm0

dBC

Selected

= −40 dBm0

dBC

= −45 dBm0

dBC

STD

Single to Total Distortion

Sinusoidal Test Method

Receive with Resistive

Level = +3.1 dBm0

Load

L = 600Ω,GR = −0.5 dB

dBC

L = 300Ω,GR = −1.2 dB

dBC

SFD

Single Frequency

−46

Distortion, Transmit

SFD

Single Frequency

−46

Distortion, Receive

IMD

Intermodulation Distortion

Transmit or Receive

Two Frequencies in the Range

−41

300 Hz–3400 Hz

CROSSTALK

X-R

Transmit to Receive Crosstalk,

f = 300 Hz–3400 Hz

−90

−75

0 dBm0 Transmit Level

R = Idle Code

R-X

Receive to Transmit Crosstalk,

f = 300 Hz–3400 Hz

−90

−70

0 dBm0 Receive Level

(Note 16)

Note 15: Measured by grounded input at VFXI.

Note 16: PPSRX, NPSRX, and CTR-X are measured with a −50 dBm0 activation signal applied to VFXI.

Note 17: A signal is Valid if it is above VIHor below VIL and Invalid if it is between VIL and VIH. For the purposes of this specification the following conditions apply:

a) All input signals are defined as: VIL = 0.4V, VIH = 2.7V, tR < 10 ns, tF < 10 ns.

b) tR is measured from VIL to VIH.tF is measured from VIH to VIL.

c) Delay Times are measured from the input signal Valid to the output signal Valid.

d) Setup Times are measured from the data input Valid to the clock input Invalid.

e) Hold Times are measured from the clock signal Valid to the data input Invalid.

f) Pulse widths are measured from VIL to VIL or from VIH to VIH.

Note 18: A multi-tone test technique is used.

TP3076 数据表(PDF) 17 Page - National Semiconductor (TI)

TP3076 数据表(HTML) 17 Page - National Semiconductor (TI)

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18

数据表下载