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HPC16003 数据表(PDF) 6 Page - National Semiconductor (TI) |
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HPC16003 数据表(HTML) 6 Page - National Semiconductor (TI) |
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6 / 36 page ![]() 30 MHz AC Electrical Characteristics (See Notes 1 and 4 and Figure 1 thru Figure 5 )VCC e 50V g10% unless otherwise specified TA e 0 Cto a70 C for HPC46083HPC46003 b40 Cto a85 C for HPC36083HPC36003 b40 Cto a105 C for HPC26083HPC26003 b55 Cto a 125 C for HPC16083HPC16003 (Continued) Symbol and Formula Parameter Min Max Units Notes tDC1ALER Delay from CKI Rising Edge to ALE Rising Edge 0 35 ns (Notes 1 2) tDC1ALEF Delay from CKI Rising Edge to ALE Falling Edge 0 35 ns (Notes 1 2) tDC2ALER e tC a 20 Delay from CK2 Rising Edge to ALE Rising Edge 37 ns (Note 2) tDC2ALEF e tC a 20 Delay from CK2 Falling Edge to ALE Falling Edge 37 ns (Note 2) tLL e tC b 9 ALE Pulse Width 24 ns tST e tC b 7 Setup of Address Valid before ALE Falling Edge 9 ns tVP e tC b 5 Hold of Address Valid after ALE Falling Edge 11 ns tARR e tC b 5 ALE Falling Edge to RD Falling Edge 12 ns tACC e tC a WS b 32 Data Input Valid after Address Output Valid 100 ns (Note 6) tRD e tC a WS b 39 Data Input Valid after RD Falling Edge 60 ns tRW e tC a WS b 14 RD Pulse Width 85 ns tDR e tC b 15 Hold of Data Input Valid after RD Rising Edge 0 35 ns tRDA e tC b 15 Bus Enable after RD Rising Edge 51 ns tARW e tC b 5 ALE Falling Edge to WR Falling Edge 28 ns tWW e tC a WS b 15 WR Pulse Width 101 ns tV e tC a WS b 5 Data Output Valid before WR Rising Edge 94 ns tHW e tC b 10 Hold of Data Valid after WR Rising Edge 7 ns tDAR e tC a WS b 50 Falling Edge of ALE to Falling Edge of RDY 33 ns tRWP e tC RDY Pulse Width 66 ns Note CL e 40 pF Note 1 These AC characteristics are guaranteed with external clock drive on CKI having 50% duty cycle and with less than 15 pF load on CKO wih rise and fall times (tCKIR and tCKIL) on CKI input less than 25 ns Note 2 Do not design with these parameters unless CKI is driven with an active signal When using a passive crystal circuit its stability is not guaranteed if either CKI or CKO is connected to any external logic other than the passive components of the crystal circuit Note 3 tHAE is spec’d for case with HLD falling edge occurring at the latest time it can be accepted during the present CPU cycle being executed If HLD falling edge occurs later tHAE as long as (3tC a 4WS a 72 tC a 100) may occur depending on the following CPU instruction cycles its wait states and ready input Note 4 WS tWAIT c (number of pre-programmed wait states) Minimum and maximum values are calculated from maximum operating frequency tC e 30 MHz with one wait state programmed Note 5 Due to emulation restrictionsactual limits will be better Note 6 This is guaranteed by design and not tested CKI Input Signal Characteristics RiseFall Time TLDD8801 – 35 Duty Cycle TLDD8801 – 36 FIGURE 1 CKI Input Signal TLDD8801 – 38 FIGURE 2 Input and Output for AC Tests Note AC testing inputs are driven at VIH for a logic ‘‘1’’ and VIL for a logic ‘‘0’’ Output timing measurements are made at 20V for a logic ‘‘1’’ and 08V for a logic ‘‘0’’ 6 |
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