| 制造商 | 部件名 | 数据表 | 功能描述 |
 National Semiconductor ... |
AD-03
|
43Kb / 4P |
Effects of Aperture Time and Jitter in a Sampled Data System
|
 M/A-COM Technology Solu... |
S2080
|
45Kb / 2P |
Moisture Effects on the Soldering of Plastic Encapsulated Devices
|
 Analog Devices |
AN-756
|
298Kb / 12P |
Sampled Systems and the Effects of Clock Phase Noise and Jitter
REV. 0 |
 Freescale Semiconductor... |
S9S08SL8F1CTJ
|
2Mb / 356P |
provides the functional version of the on-chip modules
|
 STMicroelectronics |
AN2984
|
224Kb / 8P |
Minimizing the SET-related effects
23-Jun-2010 |
|
AN2143
|
377Kb / 8P |
Programming the ST10F27X embedded Flash
24-Sep-2013 |
|
AN2168
|
201Kb / 15P |
The ST10F27x MCUs are derivatives of the STMicroelectronics
24-Sep-2013 |
|
AN2341
|
176Kb / 26P |
Programming ST10F27x/F25x CAN interrupt drivers
24-Sep-2013 |
|
AN2628
|
205Kb / 27P |
Programming ST10F27x CAN interrupt drivers
18-Oct-2007 |
 Dynex Semiconductor |
AN4870
|
81Kb / 5P |
Effects Of Temperature On Thyristor Performance
|