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AD5544BCPZ-R2 数据表(PDF) 6 Page - Analog Devices |
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AD5544BCPZ-R2 数据表(HTML) 6 Page - Analog Devices |
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6 / 24 page ![]() AD5544/AD5554 Data Sheet Rev. H | Page 6 of 24 Parameter Symbol Test Condition/Comments Min Typ Max Unit Clock to CS Hold t CSH 25 ns Clock to SDO Propagation Delay t PD 2 20 ns Load DAC Pulse Width t LDAC 25 ns Data Setup t DS 20 ns Data Hold t DH 20 ns Load Setup t LDS 5 ns Load Hold t LDH 25 ns SUPPLY CHARACTERISTICS Power Supply Range V DD RANGE 2.7 5.5 V Positive Supply Current I DD Logic inputs = 0 V 5 µA Negative Supply Current I SS Logic inputs = 0 V, V SS = −5 V 0.001 9 µA Power Dissipation P DISS Logic inputs = 0 V 1.25 mW Power Supply Sensitivity PSS ∆V DD = ±5% 0.006 %/% AC CHARACTERISTICS4 Output Voltage Settling Time t S To ±0.1% of full scale, data = 0x0000 to 0x3FFF to 0x0000 0.9 µs Reference Multiplying Bandwidth (BW) BW − 3 dB V REFx = 5 V p-p, data = 0xFFFF, CFB = 2.0 pF 12 MHz DAC Glitch Impulse Q V REFx = 8 V, data = 0x0000 to 0x2000 to 0x0000 −1 nV-sec Feedthrough Error V OUTx/VREFx Data = 0x0000, V REFx = 100 mV rms, f = 100 kHz −65 dB Crosstalk Error V OUTA/VREFB Data = 0x0000, V REFB = 100 mV rms, adjacent channel, f = 100 kHz −90 dB Digital Feedthrough Q CS = 1, fCLK = 1 MHz 0.6 nV-sec Total Harmonic Distortion THD V REFx = 5 V p-p, data = 0x3FFF, f = 1 kHz −98 dB Output Spot Noise Voltage e N f = 1 kHz, BW = 1 Hz 7 nV/√Hz 1 All static performance tests (except I OUT) are performed in a closed-loop system using an external precision OP177 I-to-V converter amplifier. The AD5554 RFB terminal is tied to the amplifier output. Typical values represent average readings measured at 25°C. 2 These parameters are guaranteed by design and not subject to production testing. 3 All input control signals are specified with t R = tF = 2.5 ns (10% to 90% of 3 V) and timed from a voltage level of 1.5 V. 4 All ac characteristic tests are performed in a closed-loop system using an AD8038 I-to-V converter amplifier,. |
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