2003-04-15

2

F 2000D

Elektrische Werte (

T

Electrical values

Bezeichnung

Parameter

Symbol

Symbol

Wert

Value

2)

Einheit

Unit

min.

typ.

max.

Dominantwellenlänge

Dominant wavelength

I

λ

dom

613

623

nm

Sperrspannung

Reverse voltage

I

V

R

12

V

Durchla

βspannung

Forward voltage

I

V

F

2.6

V

Lichtstrom

Luminous Flux

3)

I

Φ

V

8000

mlm

1)

Measurement limits describe actual settings and do not include measurement uncertainties. Each wafer and fragment

of a wafer is subject to final testing. The wafer or its pieces are individually attached on foils (rings). Sample chips are

picked from each foil and placed on a special carrier for measurement purposes.

Sample-test: Sampling density/samples per cm² (grid): 1,6/cm².

If a sample fails, the distance area to the next non-failure samples is manually removed by a vacuum tool.

All el. values are referenced to the vendor's measurement system (correlation to customer product(s) is required)

2)

Typical (refered to as typ.) data are defined as long-term production mean values and are only given for information.

This is not a specified value

3)

Luminous flux is measured in integrating sphere