AS29F040 datasheet(11/18 Pages) ALSC

11 / 18 page

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* Not more than one output tested simultaneously. Duration of the short circuit must not be >1 second.

OUT = 0.5V was selected to avoid test problems

caused by tester ground degradation. (This parameter is sampled and not 100% tested, but guaranteed by characterization.)

† The I

CC current listed includes both the DC operating current and the frequency dependent component (@ 6 MHz). The frequency component typically is

less than 2 mA/MHz with

OE at VIH.

** I

CC active while program or erase operations are in progress.

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Parameter

Symbol

Test conditions

Min

Max

Unit

Input load current

ILI

VIN = VSS to VCC, VCC = VCC MAX

-±1

µA

A9 Input load current

ILIT

VCC = VCC MAX, A9 = 12.5V

µA

Output leakage current

ILO

VOUT = VSS to VCC, VCC = VCC MAX

-±1

µA

Output short circuit current*

IOS

VOUT = 0.5V

200

Active current, read @ 6MHz

†

ICC

CE = VIL, OE = VIH

-30

Active current, program/erase**

ICC2

CE = VIL, OE = VIH

-60

Standby current (TTL)

ISB1

CE = OE = VIH, VCC = VCC MAX

-1.0

Standby current (CMOS)

ISB2

CE = VCC + 0.5V, OE = VIH,

VCC = VCC MAX

-400

µA

Input low voltage

VIL

-0.5

0.8

Input high voltage

VIH

2.0

VCC + 0.5

Output low voltage

VOL

IOL = 12mA, VCC = VCC MIN

-0.45

Output high voltage

VOH1

IOH = -2.5 mA, VCC = VCC MIN

2.4

VOH2

IOH = -100 µA, VCC = VCC MIN

VCC - 0.4

Low VCC lock out voltage

VLKO

2.8

4.2

Input HV select voltage

VID

11.5

12.5

20 ns

-2.0V

-0.5V

+0.8V

20 ns

VCC + 2.0V

VCC + 0.5V

+ 2.0V

AS29F040 数据表(PDF) 11 Page - Alliance Semiconductor Corporation

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