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BQ27Z561-R2 数据表(PDF) 8 Page - Texas Instruments

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部件名 BQ27Z561-R2
功能描述  BQ27Z561-R2 Impedance Track??Battery Gas Gauge Solution for 1-Series Cell Li-Ion Battery Packs
PDF  22 Pages
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制造商  TI [Texas Instruments]
网页  http://www.ti.com
标志 TI - Texas Instruments

BQ27Z561-R2 数据表(HTML) 8 Page - Texas Instruments

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PARAMETER
TEST CONDITIONS
MIN
NOM
MAX
UNIT
tf
Clock fall time
90% to 10%
300
ns
tSU:STO
Setup time STOP condition
4.0
µs
tBUF
Bus free time STOP to
START
4.7
µs
7.18 I2C Timing — 400 kHz
PARAMETER
TEST CONDITIONS
MIN
NOM
MAX
UNIT
fSCL
Clock operating frequency
SCL duty cycle = 50%
400
kHz
tHD:STA
START condition hold time
0.6
µs
tLOW
Low period of the SCL Clock
1.3
µs
tHIGH
High period of the SCL Clock
600
ns
tSU:STA
Setup repeated START
600
ns
tHD:DAT
Data hold time (SDA input)
0
ns
tSU:DAT
Data setup time (SDA input)
100
ns
tr
Clock rise time
10% to 90%
300
ns
tf
Clock fall time
90% to 10%
300
ns
tSU:STO
Setup time STOP condition
0.6
µs
tBUF
Bus free time STOP to
START
1.3
µs
7.19 HDQ Timing
PARAMETER
TEST CONDITIONS
MIN
NOM
MAX
UNIT
tB
Break time
190
µs
tBR
Break recovery time
40
µs
tHW1
Host write 1 time
Host drives HDQ
0.5
50
µs
tHW0
Host write 0 time
Host drives HDQ
86
145
µs
tCYCH
Cycle time, host to device
Device drives HDQ
190
µs
tCYCD
Cycle time, device to Host
Device drives HDQ
190
205
250
µs
tDW1
Device write 1 time
Device drives HDQ
32
50
µs
tDW0
Device write 0 time
Device drives HDQ
80
145
µs
tRSPS
Device response time
Device drives HDQ
190
950
µs
tTRND
Host turn around time
Host drives HDQ after device drives
HDQ
250
µs
tRISE
HDQ line rising time to logic
1
1.8
µs
tRST
HDQ Reset
Host drives HDQ low before device
reset
2.2
s
SCL
SDA
tHD;STA
tLOW
tr
tHD;DAT
tHIGH
tf
tSU;DAT
tSU;STA
tSU;STO
tf
START
REPEATED
START
STOP
tHD;STA
START
tSP
tr
tBUF
Figure 7-1. I2C Timing
BQ27Z561-R2
SLUSE22 – SEPTEMBER 2020
www.ti.com
8
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Copyright © 2020 Texas Instruments Incorporated
Product Folder Links: BQ27Z561-R2



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