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ADPA9002ACGZN-R7 数据表(PDF) 18 Page - Analog Devices

部件名 ADPA9002ACGZN-R7
功能描述  GaAs, pHEMT, MMIC, Single Positive Supply, DC to 10 GHz Power Amplifier
PDF  19 Pages
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制造商  AD [Analog Devices]
网页  http://www.analog.com
标志 AD - Analog Devices

ADPA9002ACGZN-R7 数据表(HTML) 18 Page - Analog Devices

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ADPA9002
Data Sheet
Rev. 0 | Page 18 of 19
APPLICATIONS INFORMATION
Capacitive bypassing is required for VDD and VGG1, as shown in
Figure 62. Both the RFIN and RFOUT/VDD pins are dc-coupled.
Use of an external dc blocking capacitor at RFIN is recommended.
Use of an external RF choke plus a dc blocking capacitor (for
example, a bias tee) at the RFOUT/VDD pin is required. For
wideband applications, ensure that the frequency responses of
the external biasing and blocking components are adequate for
use across the entire frequency range of the application.
The ADPA9002 operates in either self biased or externally
biased mode. Ground the VGG1 pin to operate the device in self
biased mode. For the externally biased configuration, adjust the
VGG1 pin within −2 V to +0.5 V to set the target drain.
The recommended bias sequence during power-up for self biased
operation is as follows:
1. Connect the VGG1 pin to ground and ground all GND pins.
2. Set VDD to 12 V.
3. Apply the RF signal to the RFIN pin.
The recommended bias sequence during power-down for self
biased operation is as follows:
1. Turn off the RFIN signal.
2. Set VDD to 0 V.
The recommended bias sequence during power-up for externally
biased operation is as follows:
1. Connect all GND pins to ground.
2. Set the VGG1 pin to −2 V.
3. Set VDD to 12 V.
4. Increase the VGG1 pin to achieve the IDQ.
5. Apply the RF signal to the RFIN pin.
The recommended bias sequence during power-down for
externally biased operation is as follows:
1. Turn off the RFIN signal.
2. Decrease the VGG1 pin to −2 V to achieve a typical IDQ of 0 mA.
3. Set VDD to 0 V.
4. Set the VGG1 pin to 0 V.
Take care to ensure adherence to the values shown in the
Absolute Maximum Ratings section.
Unless otherwise noted, all measurements and data shown were
taken using the typical application circuit (see Figure 62) and
biased per the conditions in this section. The bias conditions
described in this section are the operating points recommended
to optimize the overall device performance. Operation using
other bias conditions may result in performance that differs
from what is shown in the Typical Performance Characteristics
section. To obtain optimal performance while not damaging the
device, follow the recommended biasing sequences described in
this section.
TYPICAL APPLICATION CIRCUIT
In Figure 62, the drain voltage (VDD) must be applied through an
external broadband bias tee connected at the RFOUT/VDD pin and
connect an external dc block to the RFIN pin. Use optional
capacitors if the device is operated below 200 MHz.
17
1
3
4
2
5
6
RFIN
7
8
18
19
20
21
RFOUT
NOTE 1
NOTE 2
NOTE 1
NOTES
1. DRAIN VOLTAGE (VDD) MUST BE APPLIED THROUGH AN ETERNAL BIAS TEE CONNECTED
AT THE RFOUT/VDD PIN AND AN EXTERNAL DC BLOCK MUST BE CONNECTED AT THE RFIN PIN.
2. USE OPTIONAL CAPACITORS IF THE DEVICE IS OPERATED BELOW 200MHz.
C1
1000pF
C4
1000pF
C5
0.01µF
C9
4.7µF
VDD
22
23
24
VGG1
NOTE 2
C8
0.01µF
C10
4.7µF
C3
1000pF
C7
0.01µF
C11
4.7µF
Figure 62. Typical Application Circuit



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