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MPC7441 数据表(PDF) 21 Page - NXP Semiconductors |
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MPC7441 数据表(HTML) 21 Page - NXP Semiconductors |
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21 / 56 page ![]() MPC7447A RISC Microprocessor Hardware Specifications, Rev. 5 Freescale Semiconductor 21 Electrical and Thermal Characteristics Figure 11 provides the test access port timing diagram. Figure 11. Test Access Port Timing Diagram 5.3 Voltage and Frequency Derating To reduce the power consumption of the device, these devices support voltage and frequency derating whereby the core voltage (VDD) may be reduced if the reduced maximum processor core frequency requirements are observed. The supported derated core voltage, resulting maximum processor core frequency (fcore), and power consumption are provided in Table 11. Only those parameters in Table 11 are affected; all other parameter specifications are unaffected. Table 11. Supported Voltage, Core Frequency, and Power Consumption Derating Maximum Rated Core Frequency (Device Marking) Supported Derated Core Voltage (VDD) Maximum Derated Core Frequency (fcore) Full-Power Mode Power Consumption Maximum Typical 1000 1.20 V ±50mV 867 MHz 15.5 W 10.5 W 1267 1065 MHz 18.2 W 12.3 W 1333 1167 MHz 18.1 W 12.3 W 1420 1267 MHz 21.0 W 14.2 W VM TCK TDI, TMS TDO Output Data Valid VM = Midpoint Voltage (OVDD/2) tIXJH tIVJH tJLOV tJLOZ Input Data Valid TDO Output Data Valid tJLOX VM |
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