| 数据搜索系统,热门电子元器件搜索 |
|
STM8L151C2 数据表(PDF) 78 Page - STMicroelectronics |
|
|
|||||||||||||||||||||||||||||
STM8L151C2 数据表(HTML) 78 Page - STMicroelectronics |
|
78 / 123 page ![]() Electrical parameters STM8L151x2, STM8L151x3 78/123 DS7204 Rev 11 9.3.5 Memory characteristics TA = -40 to 125 °C unless otherwise specified. Flash memory Table 34. RAM and hardware registers Symbol Parameter Conditions Min Typ Max Unit VRM Data retention mode (1) 1. Minimum supply voltage without losing data stored in RAM (in Halt mode or under Reset) or in hardware registers (only in Halt mode). Guaranteed by characterization results. Halt mode (or Reset) 1.65 - - V Table 35. Flash program and data EEPROM memory Symbol Parameter Conditions Min Typ Max (1) Unit VDD Operating voltage (all modes, read/write/erase) fSYSCLK = 16 MHz 1.65 - 3.6 V tprog Programming time for 1 or 64 bytes (block) erase/write cycles (on programmed byte) -- 6 - ms Programming time for 1 to 64 bytes (block) write cycles (on erased byte) -- 3 - ms Iprog Programming/ erasing consumption TA=+25 °C, VDD = 3.0 V - 0.7 - mA TA=+25 °C, VDD = 1.8 V - 0.7 - tRET (2) Data retention (program memory) after 10000 erase/write cycles at TA= –40 to +85 °C (3 and 6 suffix) TRET = +85 °C 30(1) -- years Data retention (program memory) after 10000 erase/write cycles at TA= –40 to +125 °C (3 suffix) TRET = +125 °C 5(1) -- Data retention (data memory) after 300000 erase/write cycles at TA= –40 to +85 °C (3 and 6 suffix) TRET = +85 °C 30(1) -- Data retention (data memory) after 300000 erase/write cycles at TA= –40 to +125 °C (3 suffix) TRET = +125 °C 5(1) -- NRW (3) Erase/write cycles (program memory) TA = –40 to +85 °C (3 and 6 suffix), TA = –40 to +105 °C (3 suffix) or TA = –40 to +125 °C (3 suffix) 10(1) -- kcycles Erase/write cycles (data memory) 300(1) (4) -- 1. Guaranteed by characterization results. 2. Conforming to JEDEC JESD22a117 3. The physical granularity of the memory is 4 bytes, so cycling is performed on 4 bytes even when a write/erase operation addresses a single byte. 4. Data based on characterization performed on the whole data memory. |
|
链接网址 |
| ALLDATASHEET是否为您带来帮助? [ DONATE ] |
关于 Alldatasheet | 广告服务 | 联系我们 | 隐私政策 | 数据表链接 | 链接交换 | 制造商名单 All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |