STM8L151C2 datasheet(101/123 Pages) STMICROELECTRONICS

101 / 123 page

DS7204 Rev 11

101/123

STM8L151x2, STM8L151x3

Electrical parameters

102

A device reset allows normal operations to be resumed. The test results are given in the

table below based on the EMS levels and classes defined in application note AN1709.

Designing hardened software to avoid noise problems

EMC characterization and optimization are performed at component level with a typical

application environment and simplified MCU software. It should be noted that good EMC

performance is highly dependent on the user application and the software in particular.

Therefore it is recommended that the user applies EMC software optimization and

prequalification tests in relation with the EMC level requested for his application.

Prequalification trials

Most of the common failures (unexpected reset and program counter corruption) can be

reproduced by manually forcing a low state on the NRST pin or the Oscillator pins for 1

second.

To complete these trials, ESD stress can be applied directly on the device, over the range of

specification values. When unexpected behavior is detected, the software can be hardened

to prevent unrecoverable errors occurring (see application note AN1015).

Electromagnetic interference (EMI)

Based on a simple application running on the product (toggling 2 LEDs through the I/O

ports), the product is monitored in terms of emission. This emission test is in line with the

norm IEC61967-2 which specifies the board and the loading of each pin.

Table 53. EMS data

Symbol

Parameter

Conditions

Level/

Class

VFESD

Voltage limits to be applied on

any I/O pin to induce a functional

disturbance

VDD = 3.3 V, TA = +25 °C,

fCPU= 16 MHz,

conforms to IEC 61000

VEFTB

Fast transient voltage burst limits

to be applied through 100 pF on

VDD and VSS pins to induce a

functional disturbance

VDD = 3.3 V, TA = +25 °C,

fCPU = 16 MHz,

conforms to IEC 61000

Using HSI

Using HSE

Table 54. EMI data (1)

Not tested in production.

Symbol

Parameter

Conditions

Monitored

frequency band

Max vs.

Unit

16 MHz

SEMI

Peak level

VDD = 3.6 V,

TA = +25 °C,

LQFP48

conforming to

IEC61967-2

0.1 MHz to 30 MHz

-3

μV

30 MHz to 130 MHz

130 MHz to 1 GHz

SAE EMI Level

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