PPC5604BAMLL6R datasheet(6/109 Pages) NXP

6 / 109 page

MPC5604B/C Microcontroller Data Sheet, Rev. 15

Introduction

NXP Semiconductors

Table 2 summarizes the functions of all blocks present in the MPC5604B/C series of microcontrollers.

Please note that the presence and number of blocks vary by device and package.

Table 2. MPC5604B/C series block summary

Block

Function

Analog-to-digital converter (ADC) Multi-channel, 10-bit analog-to-digital converter

Boot assist module (BAM)

A block of read-only memory containing VLE code which is executed according

to the boot mode of the device

Clock monitor unit (CMU)

Monitors clock source (internal and external) integrity

Cross triggering unit (CTU)

Enables synchronization of ADC conversions with a timer event from the eMIOS

or from the PIT

Deserial serial peripheral interface

(DSPI)

Provides a synchronous serial interface for communication with external devices

Error Correction Status Module

(ECSM)

Provides a myriad of miscellaneous control functions for the device including

program-visible information about configuration and revision levels, a reset status

information on memory errors reported by error-correcting codes

Enhanced Direct Memory Access

(eDMA)

Performs complex data transfers with minimal intervention from a host processor

via “n” programmable channels.

Enhanced modular input output

system (eMIOS)

Provides the functionality to generate or measure events

Flash memory

Provides non-volatile storage for program code, constants and variables

FlexCAN (controller area network) Supports the standard CAN communications protocol

Frequency-modulated

phase-locked loop (FMPLL)

Generates high-speed system clocks and supports programmable frequency

modulation

Internal multiplexer (IMUX) SIU

subblock

Allows flexible mapping of peripheral interface on the different pins of the device

Inter-integrated circuit (I2C™) bus A two wire bidirectional serial bus that provides a simple and efficient method of

data exchange between devices

Interrupt controller (INTC)

Provides priority-based preemptive scheduling of interrupt requests

JTAG controller

Provides the means to test chip functionality and connectivity while remaining

transparent to system logic when not in test mode

LINFlex controller

Manages a high number of LIN (Local Interconnect Network protocol) messages

efficiently with a minimum of CPU load

Clock generation module

(MC_CGM)

Provides logic and control required for the generation of system and peripheral

clocks

Mode entry module (MC_ME)

Provides a mechanism for controlling the device operational mode and mode

transition sequences in all functional states; also manages the power control unit,

reset generation module and clock generation module, and holds the

configuration, control and status registers accessible for applications

Power control unit (MC_PCU)

Reduces the overall power consumption by disconnecting parts of the device

from the power supply via a power switching device; device components are

grouped into sections called “power domains” which are controlled by the PCU

Reset generation module

(MC_RGM)

Centralizes reset sources and manages the device reset sequence of the device

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