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USB7006/KDX 数据表(PDF) 12 Page - Microchip Technology |
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USB7006/KDX 数据表(HTML) 12 Page - Microchip Technology |
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12 / 56 page ![]() USB7006 DS00003715B-page 12 2022 Microchip Technology Inc. and its subsidiaries SPI Chip Enable SPI_CE_N I/O12 Active low SPI chip enable input. If the SPI interface is enabled, this pin must be driven high in powerdown states. Note 3-2 Operates as the CFG_NON_REM strap if external SPI memory is not used. It must be terminated with the selected strap resistor to 3.3V or GND. Note 3-2 Miscellaneous Programmable Function Pins PF[31:3] I/O12 Programmable function pins. Note 3-3 If unused: depends on the configured pin function. Refer to Section 3.3.4, PF[31:3] Configuration (CFG_STRAP[2:1]) Note 3-3 Test 1 TEST1 A Test 1 pin. This signal is used for test purposes and must always be pulled-up to 3.3V via a 10 k resistor. Pull to 3.3V through a 10 k resistor Test 2 TEST2 A Test 2 pin. This signal is used for test purposes and must always be pulled-up to 3.3V or GND via a 10 k resistor. Pull to 3.3V or GND through a 10 k resistor Test 3 TEST3 A Test 3 pin. This signal is used for test purposes and must always be pulled-up to 3.3V or GND via a 10 k resistor. Pull to 3.3V or GND through a 10 k resistor Reset Input RESET_N IS This active low signal is used by the system to reset the device. Mandatory Note 3-5 Bias Resistor RBIAS I-R A 12.0 k 1.0% resistor is attached from ground to this pin to set the transceiver’s internal bias settings. Place the resistor as close the device as possible with a dedi- cated, low impedance connection to the ground plane. Mandatory Note 3-5 Test TESTEN I/O12 Test pin. This signal is used for test purposes and must always be connected to ground. Connect to GND Analog Test ATEST A Analog test pin. This signal is used for test purposes and must always be left unconnected. Float TABLE 3-1: PIN DESCRIPTIONS (CONTINUED) Name Symbol Buffer Type Description If Unused |
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