4

Radiations

Total dose (MIL-STD-883 TM 1019):

The products guaranteed in radiation within the RHA QML-V system fully comply with the MIL-STD-883 TM 1019

specifications.

The RHFAHC00 is RHA QML-V, tested and characterized in full compliance with the MIL-STD-883 specifications,

between 50 and 300 rad/s only (full CMOS technology).

All parameters, provided in Table 4. DC electrical characteristics and Table 5. AC electrical characteristics, apply

to both pre- and post-irradiation, as follows:

•

All tests are performed in accordance with MIL-PRF-38535 and test method 1019 of MIL-STD-883 for total

ionizing dose (TID)

•

The initial characterization is performed in qualification only on both biased and unbiased parts

•

Each wafer lot is tested at high dose rate only, in the worst bias case condition, based on the results

obtained during the initial qualification

Heavy-ions

The behavior of the product when submitted to heavy-ions is not tested in production. Heavy-ion trials are

performed on qualification lots only.

Type

Characteristics

Value

Unit

TID(1)

High-dose rate (50 rad(Si)/s) and low-dose rate (0.086 rad(Si)/s)

300

krad

Heavy-ions

125

MeV.cm²/mg

SEL immune up to:

62.5

SET(3) immune up to:

1. A total ionizing dose (TID) of 300 krad(Si) is equivalent to 3000 Gy(Si), (1 gray = 100 rad).

2. SEL: single event latch-up.

3. SET: single event transient

RHFAHC00

Radiations

DS12465 - Rev 2

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