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ADL5306ACP-R2 数据表(PDF) 12 Page - Analog Devices |
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ADL5306ACP-R2 数据表(HTML) 12 Page - Analog Devices |
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12 / 16 page ![]() ADL5306 Rev. 0 | Page 12 of 16 The use of a negative supply, VN, allows the summing node to be placed at ground level whenever the input transistor (Q1 in Figure 1) has a sufficiently negative bias on its emitter. When VN = –0.5 V, the VCE of Q1 and Q2 will be the same value as in the default case when VSUM is grounded. This bias need not be accurate, and a poorly defined source can be used. However, the source must be able to support the quiescent current as well as the INPT and IREF signal current. For example, it may be convenient to utilize a forward-biased junction voltage of about 0.7 V or a Schottky barrier voltage of a little over 0.5 V. With the summing node at ground, the ADL5306 may now be used as a voltage-input log amp, at either the numerator input INPT or the denominator input IREF by inserting a suitably scaled resistor from the voltage source to the relevant pin. The overall accuracy for small input voltages is limited by the voltage offset at the inputs of the JFET op amps. DC MATRIX / DC SUPPLIES / DMM RIBBON CABLE ADL5306 CHARACTERIZATION BOARD TRIAX CONNECTORS (SIGNAL – INPT AND IREF GUARD – VSUM SHIELD – GROUND) KEITHLEY 236 KEITHLEY 236 VSUM VLOG VOUT BFIN VNEG VPOS VREF IREF INPT 03727-0-024 Figure 24. Primary Characterization Setup The primary characterization setup shown in Figure 24 is used to measure VREF, the static (dc) performance, logarithmic conformance, slope and intercept, the voltages appearing at Pins VSUM, INPT , and IREF, and the buffer offset and VREF drift with temperature. In some cases, a fixed resistor between Pins VREF and IREF was used in place of a precision current source. For the dynamic tests, including noise and bandwidth measurements, more specialized setups are required. This includes close attention to the input stabilizing networks; for example, to ensure stable operation over the full current range of IREF and temperature extremes, filter components C1 = 4.7 nF and R13 = 2 kΩ are used at Pin IREF to ground. The use of a negative supply also allows the output to swing below ground, thereby allowing the intercept to correspond to a midrange value of IPD. However, the voltage VLOG remains referenced to the ACOM pin, and while VLOG does not swing negative for default operating conditions, it is free to do so. Thus, adding a resistor from VLOG to the negative supply lowers all values of VLOG, which raises the intercept. The disadvantage of this method is that the slope is reduced by the shunting of the external resistor, and the poorly defined ratio of on-chip and off-chip resistance causes errors in both the slope and intercept. A more accurate method for repositioning the intercept follows. NC INPT VREF IREF SCAL BFIN VPOS 0.1 µF +VS COMM COMM COMM COMM VNEG VNEG VSUM VOUT VLOG 1 2 3 4 567 8 9 10 11 12 13 14 15 16 ADL5306 03727-0-025 AD8138 EVALUATION BOARD HP3577A NETWORK ANALYZER +IN B A BNC-T AD8138 PROVIDES DC OFFSET OUTPUT INPUT R INPUT A INPUT B CHARACTERIZATION METHODS During the characterization of the ADL5306, the device was treated as a precision current-input logarithmic converter, because it is impractical to generate accurate photocurrents by illuminating a photodiode. The test currents were generated by using either a well-calibrated current source, such as the Keithley 236, or a high value resistor from a voltage source to the input pin. Great care is needed when using very small input currents. For example, the triax output connection from the current generator was used with the guard tied to VSUM. The input trace on the PC board was guarded by connecting adjacent traces to VSUM. These measures are needed to minimize the risk of leakage current paths. With 0.5 V as the nominal bias on the INPT pin, a leakage-path resistance of 1 GΩ to ground would subtract 0.5 nA from the input, which amounts to a –0.44 dB error for a 10 nA source current. Additionally, the very high output resistance at the input pins and the long cables commonly needed during characterization allow 60 Hz and RF emissions to introduce substantial measurement errors. Careful guarding techniques are essential to reducing the pickup of these spurious signals. Figure 25. Configuration for Buffer Amplifier Bandwidth Measurement Figure 25 shows the configuration used to measure the buffer amplifier bandwidth. The AD8138 evaluation board includes provisions to offset VLOG at the buffer input, allowing measurements over the full range of IPD using a single supply. The network analyzer input impedances are set to 1 MΩ. |
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