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831724 数据表(PDF) 6 Page - Renesas Technology Corp |
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831724 数据表(HTML) 6 Page - Renesas Technology Corp |
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6 / 23 page ![]() 6 ©2016 Integrated Device Technology, Inc Revision B November 16, 2016 831724 Datasheet Table 5B. HCSL AC Characteristics, VDD = 3.3V ± 0.3V, TA = -40°C to 85°C NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium has been reached under these conditions. NOTE 1: Measured from the differential input crossing point to the differential output crossing point. NOTE 2: Defined as skew between input paths on the same device, using the same input signal levels, measured at one specific output at the differential cross points. NOTE 3: This parameter is defined in accordance with JEDEC Standard 65. NOTE 4: Defined as skew between outputs on different devices operating at the same supply voltage, same temperature, same frequency and with equal load conditions. Using the same type of inputs on each device, the outputs are measured at the differential cross points. NOTE 5: Measurement taken from differential waveform. NOTE 6: Measurement from -150mV to +150mV on the differential waveform (derived from Q minus nQ). The signal must be monotonic through the measurement region for rise and fall time. The 300mV measurement window is centered on the differential zero crossing. NOTE 7: TSTABLE is the time the differential clock must maintain a minimum ±150mV differential voltage after rising/falling edges before it is allowed to drop back into the VRB ±100 differential range. See Parameter Measurement Information Section. NOTE 8: Measurement taken from single-ended waveform. NOTE 9: Defined as the maximum instantaneous voltage including overshoot. See Parameter Measurement Information Section. NOTE 10: Defined as the minimum instantaneous voltage including undershoot. See Parameter Measurement Information Section. Notes continued on next page. NOTE 11: Measured at crossing point where the instantaneous voltage value of the rising edge of Q equals the falling edge of nQ. See Parameter Measurement Information Section Symbol Parameter Test Conditions Minimum Typical Maximum Units fOUT Output Frequency 350 MHz tjit Buffer Additive Phase Jitter, RMS 100MHz, Integration Range: 12kHz – 20MHz 0.357 0.480 ps tPD Propagation Delay; NOTE 1, 3 Any CLK, nCLK to any Q, nQ 2.7 3.9 ns tsk(o) Output Skew; NOTE 3,15 Across all outputs 175 ps tsk(i) Input Skew; NOTE 2, 3 165 ps tsk(pp) Part-to-Part Skew; NOTE 3, 4 450 ps MUXISOL Mux Isolation ƒ = 100MHz 94 dB Rising Edge Rate Rising Edge Rate; NOTE 5, 6 fOUT 125MHz 0.6 4.2 V/ns fOUT 125MHz 0.6 6.8 V/ns Falling Edge Rate Falling Edge Rate; NOTE 5, 6 fOUT 125MHz 0.6 4.5 V/ns fOUT 125MHz 0.6 6.7 V/ns TSTABLE Time before VRB is allowed; NOTE 5, 7 500 ps VRB Ringback Voltage; NOTE 5, 7 -100 100 mV VMAX Absolute Maximum Output Voltage; NOTE 8, 9 1150 mV VMIN Absolute Minimum Output Voltage; NOTE 8, 10 -300 mV VCROSS Absolute Crossing Voltage; NOTE 8, 11, 12 200 550 mV V CROSS Total Variation of VCROSS over all edges; NOTE 8, 11, 13 140 mV odc Output Duty Cycle; NOTE 14 fOUT 125MHz 46 54 % fOUT 125MHz 40 60 % |
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