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ADL5310ACP-R2 数据表(PDF) 17 Page - Analog Devices |
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ADL5310ACP-R2 数据表(HTML) 17 Page - Analog Devices |
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17 / 20 page ![]() ADL5310 Rev. A | Page 17 of 20 EVALUATION BOARD An evaluation board is available for the ADL5310 (Figure 40 shows the schematic). It can be configured for a wide variety of experiments. The gain of each buffer amp is factory-set to unity, providing a slope of 200 mV/dec, and the intercept is set to 300 pA. Table 4 describes the various configuration options. Table 4. Evaluation Board Configuration Options Component Function Default Condition P1 Supply Interface. Provides access to the Supply Pins VNEG, COMM, and VPOS. P1 = installed P2, R1, R3, R8, R9, R17, R22, R25, R30 Monitor Interface. By adding 0 Ω resistors to R1, R3, R8, R9, R17, R22, and R25, the VRDZ, VREF, VSUM, BIN1, BIN2, OUT1, and OUT2 pin voltages can be monitored using a high impedance probe. VBIAS allows for the external bias voltages to be applied to J1 and J2. If R30 = 0 Ω, VBIAS = VREF. P2 = not installed R1 = R3 = R8 = open (size 0402) R9 = R17 = open (size 0402) R22 = R25 = R30 = open (size 0402) R5, R6, R7, R16, R18, R19, R20, R21, R31, R32, C4, C14, C15, C16, C19, C20 Buffer Amplifier/Output Interface. The logarithmic slopes of the ADL5310 can be altered using each buffer’s gain-setting resistors, R5 and R6, and R18 and R19. R7, R16, R31, R32, C19, and C20 allow for variation in the buffer loading. R20, R21, C4, C14, C15, and C16 are provided for a variety of filtering applications. R5 = R19 = 0 Ω (size 0402) R7 = R16 = 0 Ω (size 0402) R20 = R21 = 0 Ω (size 0402) R6 = R18 = open (size 0402) R31 = R32 = open (size 0402) C4 = C14 = open (size 0402) C19 = C20 = open (size 0402) C15 = C16 = open (size 0402) LOG1 = OUT1 = installed LOG2 = OUT2 = installed R2, R28, R29 Intercept Adjustment. The voltage dropped across Resistors R28 and R29 determines the intercept reference current for each log amp, nominally set to 3 µA using a 665 kΩ 1% resistor. R2 can be used to adjust the output offset voltage at the LOG1 and LOG2 outputs. R28 = R29 = 665 kΩ (size 0402) R2 = 0 Ω (size 0402) R4, R10, R11, C2, C3, C5, C6, C8, C9 Supply Decoupling. C2 = C5 = C9 = 100 pF (size 0402) C3 = C6 = C8 = 0.01 µF (size 0402) R4 = R10 = R11 = 0 Ω (size 0402) C1, C7 Filtering VSUM. C1 = C7 = 0.01 µF (size 0402) R12, R13, R14, R15, C10, C11, C12, C13 Input Compensation. Provides essential HF compensation at the Input Pins INP1, INP2, IRF1, and IRF2. R12 = R15 = 1 kΩ (size 0402) R13 = R14 = 2 kΩ (size 0402) C10 = C13 = 1 nF (size 0402) C11 = C12 = 4.7 nF (size 0402) IREF, INPT Input Interface. The test board is configured to accept current through the SMA connectors labeled INP1 and INP2. Through-holes are provided to connect photodiodes in place of the INP1 and INP2 SMAs for optical interfacing. By removing R28 (R29 for INP2), a second current can be applied to the IRF1 (IRF2 for INP2) input (also SMA) for evaluating the ADL5310 in log ratio applications. IREF = INPT = installed J1, J2 SC-Style Photodiode. Provides for the direct mounting of SC-style photodiodes. J1 = J2 = open |
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