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ABSOLUTE MAXIMUM RATINGS

(1)

TSC2007

SBAS405 – MARCH 2007

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be

more susceptible to damage because very small parametric changes could cause the device not to meet its published

specifications.

TYPICAL

TYPICAL

NO MISSING

INTEGRAL

GAIN

CODES

SPECIFIED

TRANSPORT

LINEARITY

ERROR

RESOLUTION

PACKAGE

PACKAGE

TEMPERATURE

PACKAGE

ORDERING

MEDIA,

PRODUCT

(LSB)

(LSB)

(BITS)

TYPE

DESIGNATOR

RANGE

MARKING

NUMBER

QUANTITY

TSC2007IPW

Tube, 90

16-Pin,

5 x 6.4

PW

–40

°C to +85°C

TSC2007I

Tape and

TSC2007IPWR

TSSOP

Reel, 2000

TSC2007I

±1.5

0.1

11

Small Tape

12-Pin,

TSC2007IYZGT

and Reel, 250

3 x 4 Matrix,

YZG

–40

°C to +85°C

TSC2007I

1.5 x 2

Tape and

TSC2007IYZGR

WCSP

Reel, 3000

(1)

For the most current package and ordering information, see the Package Option Addendum located at the end of this data sheet, or see

Over operating free-air temperature range (unless otherwise noted)

TSC2007

UNIT

Analog input X+, Y+, AUX to GND

–0.4 to VDD + 0.1

V

Voltage

Analog input X–, Y– to GND

–0.4 to VDD + 0.1

V

Voltage range

VDD to GND

–0.3 to +5

V

Digital input voltage to GND

–0.3 to VDD + 0.3

V

Digital output voltage to GND

–0.3 to VDD + 0.3

V

Power dissipation

TSSOP Package

86

Thermal impedance,

θ

JA

Low-K

113

°C/W

WCSP package

High-K

62

–40 to +85

°C

–65 to +150

°C

+150

°C

Vapor phase (60 sec)

+215

°C

Lead temperature

Infrared (15 sec)

+220

°C

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated is not implied. Exposure to

absolute-maximum rated conditions for extended periods may affect device reliability.

2

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