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SN65MLVD080 数据表(PDF) 7 Page - Texas Instruments |
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SN65MLVD080 数据表(HTML) 7 Page - Texas Instruments |
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7 / 28 page ![]() www.ti.com PARAMETER MEASUREMENT INFORMATION VAB A B IA VB VA VOS VA + VB 2 VI D VCC IB II VAB 49.9 Ω 3.32 k Ω 3.32 k Ω _ + -1 V ≤ Vtest ≤ 3.4 V A B D VOS R1 24.9 Ω A C3 2.5 pF VOS(PP) ∆VOS(SS) VOS(SS) ≈ 1.3 V B A ≈ 0.7 V B D R2 24.9 Ω C1 1 pF C2 1 pF VTest + - A B IOS 0 V or VCC -1 V or 3.4 V SN65MLVD080 SN65MLVD082 SLLS581B – SEPTEMBER 2003 – REVISED SEPTEMBER 2005 Figure 1. Driver Voltage and Current Definitions NOTE: All resistors are 1% tolerance. Figure 2. Differential Output Voltage Test Circuit A. All input pulses are supplied by a generator having the following characteristics: tr or tf ≤ 1 ns, pulse frequency = 1 MHz, duty cycle = 50 ±5%. B. C1, C2 and C3 include instrumentation and fixture capacitance within 2 cm of the D.U.T. and are ±20%. C. R1 and R2 are metal film, surface mount, ±1%, and located within 2 cm of the D.U.T. D. The measurement of VOS(PP) is made on test equipment with a –3 dB bandwidth of at least 1 GHz. Figure 3. Test Circuit and Definitions for the Driver Common-Mode Output Voltage Figure 4. Driver Short-Circuit Test Circuit 7 Submit Documentation Feedback |
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