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ST10F273E 数据表(PDF) 132 Page - STMicroelectronics |
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ST10F273E 数据表(HTML) 132 Page - STMicroelectronics |
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132 / 179 page ![]() Electrical characteristics ST10F273E 132/179 Figure 35. Port2 test mode structure Figure 36. Supply current versus the operating frequency (RUN and IDLE modes) 10. The Idle mode supply current is a function of the operating frequency (fCPU is expressed in MHz). This dependency is illustrated in the Figure 35 below. These parameters are tested and at maximum CPU clock with all outputs disconnected and all inputs at VIL or VIH, RSTIN pin at VIH1Min. 11. This parameter is tested including leakage currents. All inputs (including pins configured as inputs) at 0 V to 0.1 V or at VDD – 0.1 V to VDD, VAREF = 0 V, all outputs (including pins configured as outputs) disconnected. Besides, the Main Voltage Regulator is assumed off: in case it is not, additional 1mA shall be assumed. The value for this parameter shall be considered as “Target Value” to be confirmed by silicon characterization. 12. Overload conditions occur if the standard operating conditions are exceeded, i.e. the voltage on any pin exceeds the specified range (i.e. VOV > VDD + 0.3 V or VOV < –0.3 V). The absolute sum of input overload currents on all port pins may not exceed 50mA. The supply voltage must remain within the specified limits. 13. This parameter is tested including leakage currents. All inputs (including pins configured as inputs) at 0 V to 0.1 V or at VDD – 0.1 V to VDD, VAREF = 0 V, all outputs (including pins configured as outputs) disconnected. Besides, the Main Voltage Regulator is assumed off: in case it is not, additional 1mA shall be assumed. The value for this parameter shall be considered as “Target Value” to be confirmed by silicon characterization. Input latch Clock P2.0 CC0IO Output buffer Test mode Alternate data input Fast external interrupt input Flash sense amplifier and column decoder fCPU [MHz] 10 20 50 40 30 50 60 70 0 0 ICC1 ICC2 IID |
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