TLV2341IP datasheet(44/53 Pages) TI2

44 / 53 page

TLV2341, TLV2341Y

LinCMOS

™ PROGRAMMABLE LOW-VOLTAGE

OPERATIONAL AMPLIFIERS

SLOS110A – MAY 1992 – REVISED AUGUST 1994

POST OFFICE BOX 655303

• DALLAS, TEXAS 75265

PARAMETER MEASUREMENT INFORMATION

input bias current

Because of the high input impedance of the TLV2341 operational amplifier, attempts to measure the input bias

current can result in erroneous readings. The bias current at normal ambient temperature is typically less than

1 pA, a value that is easily exceeded by leakages on the test socket. Two suggestions are offered to avoid

erroneous measurements:

• Isolatethedevicefromotherpotentialleakagesources.Useagroundedshieldaroundandbetweenthe

device inputs (see Figure 95). Leakages that would otherwise flow to the inputs are shunted away.

• Compensate for the leakage of the test socket by actually performing an input bias current test (using a

picoammeter) with no device in the test socket. The actual input bias current can then be calculated by

subtracting the open-socket leakage readings from the readings obtained with a device in the test

socket.

Many automatic testers as well as some bench-top operational amplifier testers use the servo-loop

technique with a resistor in series with the device input to measure the input bias current (the voltage

drop across the series resistor is measured and the bias current is calculated). This method requires

that a device be inserted into the test socket to obtain a correct reading; therefore, an open-socket

reading is not feasible using this method.

V = VIC

Figure 95. Isolation Metal Around Device Inputs (P package)

low-level output voltage

To obtain low-level supply-voltage operation, some compromise is necessary in the input stage. This

compromise results in the device low-level output voltage being dependent on both the common-mode input

voltage level as well as the differential input voltage level. When attempting to correlate low-level output

readings with those quoted in the electrical specifications, these two conditions should be observed. If

conditions other than these are to be used, please refer to the Typical Characteristics section of this data sheet.

input offset voltage temperature coefficient

Erroneous readings often result from attempts to measure temperature coefficient of input offset voltage. This

parameter is actually a calculation using input offset voltage measurements obtained at two different

temperatures. When one (or both) of the temperatures is below freezing, moisture can collect on both the device

and the test socket. This moisture results in leakage and contact resistance which can cause erroneous input

offset voltage readings. The isolation techniques previously mentioned have no effect on the leakage since the

moisture also covers the isolation metal itself, thereby rendering it useless. These measurements should be

performed at temperatures above freezing to minimize error.

full-power response

Full-power response, the frequency above which the operational amplifier slew rate limits the output voltage

swing, is often specified two ways: full-linear response and full-peak response. The full-linear response is

TLV2341IP 数据表(PDF) 44 Page - Texas Instruments

TLV2341IP 数据表(HTML) 44 Page - Texas Instruments

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53

数据表下载