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TLV2341IP 数据表(PDF) 47 Page - Texas Instruments

部件名 TLV2341IP
功能描述  LinCMOSE PROGRAMMABLE LOW-VOLTAGE OPERATIONAL AMPLIFIERS
PDF  53 Pages
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制造商  TI2 [Texas Instruments]
网页  https://www.ti.com
标志 TI2 - Texas Instruments

TLV2341IP 数据表(HTML) 47 Page - Texas Instruments

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TLV2341, TLV2341Y
LinCMOS
™ PROGRAMMABLE LOW-VOLTAGE
OPERATIONAL AMPLIFIERS
SLOS110A – MAY 1992 – REVISED AUGUST 1994
47
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
APPLICATION INFORMATION
bias selection
Bias selection is achieved by connecting the bias-select pin to one of the three voltage levels (see Figure 100).
For medium-bias applications, it is recommended that the bias-select pin be connected to the midpoint between
the supply rails. This is a simple procedure in split-supply applications, since this point is ground. In
single-supply applications, the medium-bias mode necessitates using a voltage divider as indicated. The use
of large-value resistors in the voltage divider reduces the current drain of the divider from the supply line.
However, large-value resistors used in conjunction with a large-value capacitor require significant time to charge
up to the supply midpoint after the supply is switched on. A voltage other than the midpoint may be used if it
is within the voltages specified in the following table.
BIAS MODE
BIAS-SELECT VOLTAGE
(single supply)
Low
VDD
Medium
1 V to VDD –1 V
High
GND
Figure 100. Bias Selection for Single-Supply Applications
input characteristics
The TLV2341 is specified with a minimum and a maximum input voltage that, if exceeded at either input, could
cause the device to malfunction. Exceeding this specified range is a common problem, especially in
single-supply operation. The lower the range limit includes the negative rail, while the upper range limit is
specified at VDD –1 V at TA = 25°C and at VDD –1.2 V at all other temperatures.
The use of the polysilicon-gate process and the careful input circuit design gives the TLV2341 good input offset
voltage drift characteristics relative to conventional metal-gate processes. Offset voltage drift in CMOS devices
is highly influenced by threshold voltage shifts caused by polarization of the phosphorus dopant implanted in
the oxide. Placing the phosphorus dopant in a conductor (such as a polysilicon gate) alleviates the polarization
problem, thus reducing threshold voltage shifts by more than an order of magnitude. The offset voltage drift with
time has been calculated to be typically 0.1
µV/month, including the first month of operation.
Because of the extremely high input impedance and resulting low bias-current requirements, the TLV2341 is
well suited for low-level signal processing; however, leakage currents on printed-circuit boards and sockets can
easily exceed bias-current requirements and cause a degradation in device performance. It is good practice
to include guard rings around inputs (similar to those of Figure 95 in the Parameter Measurement Information
section). These guards should be driven from a low-impedance source at the same voltage level as the
common-mode input (see Figure 101).
The inputs of any unused amplifiers should be tied to ground to avoid possible oscillation.
To BIAS SELECT
Low
High
Medium
1 M
VDD
1 M
0.01
µF



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