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BQ27Z561-R2 数据表(PDF) 6 Page - Texas Instruments |
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BQ27Z561-R2 数据表(HTML) 6 Page - Texas Instruments |
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6 / 27 page ![]() 7.9 Internal Temperature Sensor Unless otherwise noted, characteristics noted under conditions of TA = –40℃ to 85℃ PARAMETER TEST CONDITIONS MIN TYP MAX UNIT V(TEMP) Internal temperature sensor voltage drift VTEMPP 1.65 1.73 1.8 mV/°C VTEMPP – VTEMPN (assured by design) 0.17 0.18 0.19 7.10 NTC Thermistor Measurement Support Unless otherwise noted, characteristics noted under conditions of TA = –40℃ to 85℃ PARAMETER TEST CONDITIONS MIN TYP MAX UNIT RNTRC(PU) Internal pullup resistance 14.4 18 21.6 kΩ RNTC(DRIFT) Resistance drift over temperature –250 –120 0 PPM/°C 7.11 Coulomb Counter (CC) Unless otherwise noted, characteristics noted under conditions of TA = –40℃ to 85℃ PARAMETER TEST CONDITIONS MIN TYP MAX UNIT V(CC_IN) Differential input voltage range –0.1 0.1 V t(CC_CONV) Conversion time Single conversion 1000 ms Effective resolution 1 LSB 3.8 µV Integral nonlinearity 16-bit, best fit over input voltage range –22.3 5.2 +22.3 LSB Differential nonlinearity 16-bit, no missing codes 1.5 LSB Offset error 16- bit post calibration –2.6 1.3 +2.6 LSB Offset error drift 15-bit + sign, post calibration 0.04 0.07 LSB/°C Gain error 15-bit + sign, over input voltage range –492 131 +492 LSB Gain error drift 15-bit + sign, over input voltage range 4.3 9.8 LSB/°C Effective input resistance 7 MΩ 7.12 Analog Digital Converter (ADC) Unless otherwise noted, characteristics noted under conditions of TA = –40℃ to 85℃ PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VADC_TS_GPIO Input voltage range VFS = VREF2 –0.2 1.0 V VFS = VREG18 × 2 –0.2 1.44 V VBAT_MODE Battery input voltage –0.2 5.5 V Integral nonlinearity 16-bit, best fit, –0.1 V to 0.8 × VREF2 –8.4 +8.4 LSB Differential nonlinearity 16-bit, no missing codes 1.5 LSB Offset error 16-bit post calibration(1), VFS = VREF2 –4.2 1.8 +4.2 LSB Offset error drift 16-bit post calibration(1), VFS = VREF2 0.02 0.1 LSB/°C Gain Error 16-bit, –0.1 to 0.8 × VFS –492 131 +492 LSB Gain error drift 16-bit, –0.1 to 0.8 × VFS 2 4.5 LSB/°C Effective input resistance 8 MΩ t(ADC_CONV) Conversion time 11.7 ms Effective resolution 14 15 bits (1) Factory calibration BQ27Z561-R2 SLUSE22B – FEBRUARY 2020 – REVISED NOVEMBER 2022 www.ti.com 6 Submit Document Feedback Copyright © 2022 Texas Instruments Incorporated Product Folder Links: BQ27Z561-R2 |
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