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INA745AIRELR 数据表(PDF) 14 Page - Texas Instruments |
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INA745AIRELR 数据表(HTML) 14 Page - Texas Instruments |
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14 / 50 page ![]() Time (s) 0 0.5 1 1.5 2 2.5 3 3.5 4 -2 -1.5 -1 -0.5 0 0.5 1 1.5 2 ____ Input Current Step ____ ADC Current Output Figure 6-3. Device Current Transient Overshoot The transient overshoot is similar to what is observed in analog output current sense amplifiers. Understanding that this overshoot occurs when setting an overcurrent alert threshold to avoid false triggers is important. 6.3.2 Safe Operating Area The heat generated by the device power dissipation limits the maximum current that can be safely handled by the package. The current consumed to power the device is low, therefore the primary source of heating is due to the current flow through the internal shunt resistor. The maximum safe-operating current level shown in Figure 6-4 is set to verify that the heat generated in the package is limited so that the internal junction temperature of the silicon does not exceed 150°C. This data is collected on the INA745x evaluation module (SENS109A). Figure 6-4. Maximum Continuous Shunt Current vs Ambient Temperature Even though the shunt can withstand currents greater than 35A, the current measurement capability is limited by ADC full scale range of 39.32A. The ADC full scale range is also a function of temperature (see Figure 8-1). In applications with overcurrent transients, the peak amplitude and duration of the overcurrent event is important to determine the device heating. Figure 6-5 shows the peak pulse current versus pulse duration that the device can withstand before the maximum junction temperature of 150°C is exceeded. The data shown in this curve is collected at TA =-40°C, 25°C, and 125°C using the INA745x evaluation module (SENS109A). INA745A, INA745B SBOSAC3B – JULY 2023 – REVISED AUGUST 2025 www.ti.com 14 Submit Document Feedback Copyright © 2025 Texas Instruments Incorporated Product Folder Links: INA745A INA745B |
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