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TLE4941 数据表(PDF) 5 Page - Analog Devices |
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TLE4941 数据表(HTML) 5 Page - Analog Devices |
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5 / 16 page ![]() (VBAT = 13.6V, VSLEEP = 5V, IN1 = IN2 = no connection, RSET = 61.9kΩ to BAT, RPU = 10kΩ at DOUT1 and DOUT2, RL = 5kΩ to GND at AOUT1 and AOUT2, unless otherwise noted, TA = -40ºC to +125ºC. Typical values are at TA = +25ºC.) (Note 1) Note 1: All DC specifications are 100% production tested at TA = +25°C. AC specifications are guaranteed by design at TA = +25°C. Note 2: Parameters that change with the value of the RSET resistor: IIH, IIL, IIN_HYS, ISC, tBL, tRAMP, tDEL, fMAX, and PR. Note 3: Following power-up or startup from sleep mode, the start of the blanking period is delayed 20µs. PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS SLEEP Input-Voltage High VIH 2.0 V Input-Voltage Low VIL 0.8 V Input Resistance to GND RIN 50 100 kΩ AC TIMING CHARACTERISTICS Shutdown Delay from SLEEP Low to IN_ Shutoff tSHDN IIH = -14mA to GND, time from SLEEP low to IN_ drop 500mV, CL = 20pF 33 40 46 µs IN_, Blanking Time at Hall Sensor Power-Up tBL IIH = -14mA to GND, time from VIN_ = 500mV until DOUT_ high, CL = 20pF (Notes 2, 3) 76 89 103 µs IN_, Current Ramp Rate After Turn-On tRAMP IN_ = GND (Note 2) 3.6 5 6.7 mA/µs Delay from IN_ to DOUT_ (Filter Delay) tDEL From IIH to IIL or from IIL to IIH, CL = 20pF, Figure 1 (Note 2) 10.8 13.5 16 µs Delay Difference Between Rising and Falling Edges of Both Channels tDM CHALL-BYPASS = 0.01µF, IIH = -11.5mA and IIL = -7.5mA, CL = 20pF 1 µs Delay Difference Between Channels tCC CHALL-BYPASS = 0.01µF, IIH = -11.5mA and IIL = -7.5mA, CL = 20pF 500 ns Maximum Frequency on Hall Inputs fMAX CHALL-BYPASS = 0.01µF, IIH = -11.5mA and IIL = -7.5mA, CL = 20pF (Note 2) 34 39 kHz Maximum Analog Output Current During Short-to-GND Fault IMAO -1.4 mA IN_ Pulse Length Rejected by Filter to DOUT_ PR Figure 2 (Note 2) 7.8 11.5 14.6 µs MAX9621 Dual, 2-Wire Hall-Effect Sensor Interface with Analog and Digital Outputs www.maximintegrated.com Maxim Integrated │ 5 DC Electrical Characteristics (continued) |
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