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M58LW064 数据表(PDF) 23 Page - STMicroelectronics |
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M58LW064 数据表(HTML) 23 Page - STMicroelectronics |
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23 / 53 page ![]() 23/53 M58LW064A, M58LW064B Set Burst Configuration Register (SBCR). This instruction uses two command cycles. The Burst Configuration Setup command 60h is written with the address corresponding to the Set Burst Configuration Register content. Then in the sec- ond write cycle the address bus A2-A17 specifies the BCR, Burst Configuration Register, informa- tion and the command 03h. The burst length, type, latency, synchronous/asynchronous read mode and clock edge active configuration are defined in that operation. After the command 03h the device will default in the Read array mode. Status Register Bits. The P/E.C. status is indi- cated during execution with a Ready/Busy output available on DQ7. Any read attempt during Pro- gram or Erase command execution will automati- cally update the Status Register bits. The P/E.C. automatically sets bits DQ1, DQ2, DQ4, DQ5, DQ6 and DQ7. The bit DQ0 is reserved for future use and should be masked. It is not necessary to specify an address when the Status Register bits are read. The Status Register is a static memory register that is reset when RP signal is active or on a power-down operation. POWER SUPPLY Power Down. The memory provides Reset/Pow- er-down control using the input RP. When Reset/ Power-down RP is pulled to VIL the supply current drops to typically less than 1 µA, the memory is de- selected and the outputs are at high impedance. If RP is pulled to VIL during a Program or Erase op- eration, this operation is aborted after a latency time of tPLRH and the memory content is no longer valid. RESET, POWER-DOWN AND POWER-UP See Fig 16. The device is reset if the Reset/Power-down RP input is pulled to VIL for longer than tPLPH. If the device was in a Read mode then it will recover from reset after a time of tPHQV to give valid data output. If the device was executing an Erase or Program operation, with the P/E.C. active, the op- eration will abort in a time of tPLRH maximum. The device will be ready to accept new write com- mends after a time of tPHWL or tPHEL. The supply voltages VDD and VDDQ must be high a time tVDHEL or tVDHWL before a read or write cy- cle. At first power up Reset/Power-down should be held Low for a time of tVDHPH after VDD and VDDQ are high. The device will be ready to accept its first read or write commands after a time of tPUR or tPUW. COMMON FLASH INTERFACE - CFI The introduction to the JEDEC CFI specification Rel. 1.2 quotes, ”The Common Flash Interface (CFI) specification outlines a device and host sys- tem software interrogation handshake which al- lows specific software algorithms to be used for entire families of devices. This allows device-inde- pendent, JEDEC, ID independent and forward- and backward-compatible software support for the specified flash device families. It allows flash ven- dors to standardize their existing interfaces for long-term compatibility.” The CFI Query instruction RCFI describes how the device enters the CFI Query mode which enables information to be read from the Flash memory. CFI allows a system software to query the flash device to determine various electrical and timing parame- ters, density information and functions supported by the device. CFI allows the system to easily in- terface to the flash memory, to learn about its fea- tures and parameters, enabling the software to upgrade itself when necessary. Query Structure Overview The flash memory displays the CFI data structure when the CFI Query Instruction RCFI is issued. A list of the main subsections is detailed in Tables 15 to 19. |
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