SMTHBT200 datasheet(4/6 Pages) STMICROELECTRONICS

部件名	SMTHBT200

功能描述	TRISILTM FOR LINE CARD PROTECTION

PDF	6 Pages

Scroll/Zoom	100%

制造商	STMICROELECTRONICS [STMicroelectronics]

网页	http://www.st.com

标志

4 / 6 page

TEST CIRCUIT 2 for IH parameter.

-VP

VBAT = - 48 V

Surge generator

D.U.T.

This is a GO-NO GO test which allows to confirm the holding current (IH) level in a functional test circuit.

TEST PROCEDURE :

- Adjust the current level at the IH value by short circuiting the D.U.T.

- Fire the D.U.T. with a surge current : Ipp = 10A, 10/1000

µs.

- The D.U.T. will come back to the off-state within 50 ms max.

TEST CIRCUIT 1 FOR IBO and VBO parameters:

TEST PROCEDURE :

Pulse Test duration (tp = 20ms):

- For Bidirectional devices = Switch K is closed

- For Unidirectional devices = Switch K is open.

VOUT Selection

- Device with VBO

< 200 Volt

-VOUT = 250 VRMS,R1 = 140

Ω.

- Device with VBO

≥ 200 Volt

-VOUT = 480 VRMS,R2 = 240

Ω.

static

relay.

240

140

D.U.T

V BO

measure

IBO

measure

tp = 20ms

Transformer

220V/800V

Auto

Transformer

220V/2A

Vout

SMTHBT200

4/6

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