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M24C01WDS3TG 数据表(PDF) 22 Page - STMicroelectronics |
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M24C01WDS3TG 数据表(HTML) 22 Page - STMicroelectronics |
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22 / 34 page ![]() DC and AC parameters M24C16, M24C08, M24C04, M24C02, M24C01 22/34 Table 15. AC characteristics (M24Cxx-W) Test conditions specified in Table 6 and Table 13 Symbol Alt. Parameter Min. Max. Unit fC fSCL Clock frequency 400 kHz tCHCL tHIGH Clock pulse width high 600 ns tCLCH tLOW Clock pulse width low 1300 ns tDL1DL2 (1) 1. Sampled only, not 100% tested. tF SDA fall time 20 300 ns tDXCX tSU:DAT Data in setup time 100 ns tCLDX tHD:DAT Data in hold time 0 ns tCLQX tDH Data out hold time 200 ns tCLQV (2) 2. To avoid spurious Start and Stop conditions, a minimum delay is placed between SCL=1 and the falling or rising edge of SDA. tAA Clock low to next data valid (access time) 200 900 ns tCHDX (3) 3. For a reStart condition, or following a Write cycle. tSU:STA Start condition setup time 600 ns tDLCL tHD:STA Start condition hold time 600 ns tCHDH tSU:STO Stop condition setup time 600 ns tDHDL tBUF Time between Stop condition and next Start condition 1300 ns tW (4) 4. Previous devices bearing the process letter “L” in the package marking guarantee a maximum write time of 10 ms. For more information about these devices and their device identification, please ask your ST Sales Office for Process Change Notices PCN MPG/EE/0061 and 0062 (PCEE0061 and PCEE0062). tWR Write time 5 ms |
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