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HD6417618A 数据表(PDF) 536 Page - Renesas Technology Corp |
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HD6417618A 数据表(HTML) 536 Page - Renesas Technology Corp |
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536 / 646 page ![]() Section 19 User Debugging Interface (H-UDI) Rev. 6.00 Jun. 12, 2007 Page 504 of 610 REJ09B0131-0600 19.4 Operation 19.4.1 TAP Controller Figure 19.2 shows the internal states of the TAP controller. State transitions basically conform to the JTAG standard. Test-logic-reset Capture-DR Shift-DR Exit1-DR Pause-DR Exit2-DR Update-DR Select-DR-scan Run-test/idle 1 0 0 0 0 11 1 1 0 0 0 1 11 0 1 1 1 0 Capture-IR Shift-IR Exit1-IR Pause-IR Exit2-IR Update-IR Select-IR-scan 0 0 1 0 0 0 1 0 1 1 1 0 Figure 19.2 TAP Controller State Transitions Note: The transition condition is the TMS value at the rising edge of the TCK signal. The TDI value is sampled at the rising edge of the TCK signal and is shifted at the falling edge of the TCK signal. For details on change timing of the TDO value, see section 19.4.3, TDO Output Timing. The TDO pin is high impedance, except in the shift-DR and shift-IR states. A transition to the Test-Logic-Reset state is made asynchronously with TCK by driving the TRST signal 0. |
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