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ADATE304BBCZ 数据表(PDF) 16 Page - Analog Devices |
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ADATE304BBCZ 数据表(HTML) 16 Page - Analog Devices |
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16 / 52 page ![]() ADATE304 Rev. 0 | Page 16 of 52 EXTERNAL SENSE (PMUS_CHx) Table 8. Parameter Min Typ Max Unit Test Level Test Conditions/Comments EXTERNAL SENSE (PMUS_CHX) Voltage Range −1.25 +6.75 V D Input Leakage Current −20 +20 nA P Tested at −1.25 V and +6.75 V DUTGND INPUT Table 9. Parameter Min Typ Max Unit Test Level Test Conditions/Comments DUTGND INPUT Input Voltage Range, Referenced to GND −0.1 +0.1 V D Input Bias Current 1 100 μA P Tested at −100 mV and +100 mV SERIAL PERIPHERAL INTERFACE Table 10. Parameter Min Typ Max Unit Test Level Test Conditions/Comments SERIAL PERIPHERAL INTERFACE Serial Input Logic High 1.8 VCC V PF Serial Input Logic Low 0 0.7 V PF Input Bias Current −10 1 +10 μA P Tested at 0.0 V and 3.3 V SCLK Clock Rate 50 MHz PF SCLK Pulse Width 9 ns CT SCLK Crosstalk on DUTx Pin 8 mV CB PE disabled, PMU FV enabled and forcing 0 V Serial Output Logic High VCC − 0.4 VCC V PF Sourcing 2 mA Serial Output Logic Low 0 0.8 V PF Sinking 2 mA Update Time 10 μs D Maximum delay time required for the part to enter a stable state after a serial bus |
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