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SPT5510 数据表(PDF) 3 Page - Cadeka Microcircuits LLC. |
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SPT5510 数据表(HTML) 3 Page - Cadeka Microcircuits LLC. |
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3 / 8 page ![]() 3 9/27/00 SPT5510 ELECTRICAL SPECIFICATIONS TA= 25 °C, VEE=–5.2 V ±5%, 50% duty cycle clock, unless otherwise specified. TEST TEST SPT5510 PARAMETERS CONDITIONS LEVEL MIN TYP MAX UNITS Power Supply Requirements Negative Supply Current (–5.2 V) TMIN –TMAX VI 115 150 mA Nominal Power Dissipation V 600 800 mW Power Supply Rejection Ratio ∆V Supply = ±5 % I –0.6 ±0.002 0.6 % FS Voltage Input and Control Bandgap Reference Voltage V –1.2 V Bandgap Output Current TA=25 °C ±10 °C IV –110 16 220 µA Ref Amp Bandwidth3 V 40 MHz Ref Amp Input Current V 16 µA Ref Amp Output Current V 200 µA Ref In Operating Voltage V –3.4 V Digital Inputs Logic 1 Voltage TMIN –TMAX VI –1.0 –0.8 V Logic 0 Voltage TMIN –TMAX VI –1.7 –1.5 V Logic 1 Current –0.8 V V 2.5 µA Logic 0 Current –1.8 V V 0 µA Input Capacitance V 3 pF Input Setup Time (tS) IV 3.0 ns Input Hold Time (tH) IV 0.5 ns Clock Pulse Width (tPWH) IV 1.5 ns 3 Ref Amp Bandwidth is limited by its compensation network TEST LEVEL CODES All electrical characteristics are subject to the following conditions: All parameters having min/max specifi- cations are guaranteed. The Test Level column indicates the specific device testing actually performed during pro- duction and Quality Assurance inspec- tion. Any blank section in the data column indicates that the specification is not tested at the specified condition. TEST LEVEL TEST PROCEDURE I 100% production tested at the specified temperature. II 100% production tested at TA = +25 °C, and sample tested at the specified temperatures. III QA sample tested only at the specified temperatures. IV Parameter is guaranteed (but not tested) by design and characterization data. V Parameter is a typical value for information purposes only. VI 100% production tested at TA = +25 °C. Parameter is guaranteed over specified temperature range. |
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