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SPT5510 数据表(PDF) 3 Page - Cadeka Microcircuits LLC.

部件名 SPT5510
功能描述  16-BIT, 200 MWPS ECL D/A CONVERTER
PDF  8 Pages
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制造商  CADEKA [Cadeka Microcircuits LLC.]
网页  http://www.cadeka.com
标志 CADEKA - Cadeka Microcircuits LLC.

SPT5510 数据表(HTML) 3 Page - Cadeka Microcircuits LLC.

  SPT5510 Datasheet HTML 1Page - Cadeka Microcircuits LLC. SPT5510 Datasheet HTML 2Page - Cadeka Microcircuits LLC. SPT5510 Datasheet HTML 3Page - Cadeka Microcircuits LLC. SPT5510 Datasheet HTML 4Page - Cadeka Microcircuits LLC. SPT5510 Datasheet HTML 5Page - Cadeka Microcircuits LLC. SPT5510 Datasheet HTML 6Page - Cadeka Microcircuits LLC. SPT5510 Datasheet HTML 7Page - Cadeka Microcircuits LLC. SPT5510 Datasheet HTML 8Page - Cadeka Microcircuits LLC.  
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9/27/00
SPT5510
ELECTRICAL SPECIFICATIONS
TA= 25 °C, VEE=–5.2 V ±5%, 50% duty cycle clock, unless otherwise specified.
TEST
TEST
SPT5510
PARAMETERS
CONDITIONS
LEVEL
MIN
TYP
MAX
UNITS
Power Supply Requirements
Negative Supply Current (–5.2 V)
TMIN –TMAX
VI
115
150
mA
Nominal Power Dissipation
V
600
800
mW
Power Supply Rejection Ratio
∆V Supply = ±5 %
I
–0.6
±0.002
0.6
% FS
Voltage Input and Control
Bandgap Reference Voltage
V
–1.2
V
Bandgap Output Current
TA=25 °C ±10 °C
IV
–110
16
220
µA
Ref Amp Bandwidth3
V
40
MHz
Ref Amp Input Current
V
16
µA
Ref Amp Output Current
V
200
µA
Ref In Operating Voltage
V
–3.4
V
Digital Inputs
Logic 1 Voltage
TMIN –TMAX
VI
–1.0
–0.8
V
Logic 0 Voltage
TMIN –TMAX
VI
–1.7
–1.5
V
Logic 1 Current
–0.8 V
V
2.5
µA
Logic 0 Current
–1.8 V
V
0
µA
Input Capacitance
V
3
pF
Input Setup Time (tS)
IV
3.0
ns
Input Hold Time (tH)
IV
0.5
ns
Clock Pulse Width (tPWH)
IV
1.5
ns
3
Ref Amp Bandwidth is limited by its compensation network
TEST LEVEL CODES
All electrical characteristics are subject
to the following conditions:
All parameters having min/max specifi-
cations are guaranteed. The Test Level
column indicates the specific device
testing actually performed during pro-
duction and Quality Assurance inspec-
tion. Any blank section in the data
column indicates that the specification
is not tested at the specified condition.
TEST LEVEL
TEST PROCEDURE
I
100% production tested at the specified temperature.
II
100% production tested at TA = +25 °C, and sample tested at the specified
temperatures.
III
QA sample tested only at the specified temperatures.
IV
Parameter is guaranteed (but not tested) by design and characterization
data.
V
Parameter is a typical value for information purposes only.
VI
100% production tested at TA = +25 °C. Parameter is guaranteed over
specified temperature range.



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