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MAT12 数据表(PDF) 3 Page - Analog Devices |
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MAT12 数据表(HTML) 3 Page - Analog Devices |
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3 / 4 page ![]() Preliminary Technical Data MAT12 Rev. PrA | Page 3 of 4 Input Bias Current IB IC = 10μA -25ºC≤TA≤+85ºC 25 45 nA nA Input Offset Current IOS IC = 10μA -25ºC≤TA≤+85ºC 0.6 8 nA nA Input Offset Current Drift ΔIOS/ΔT IC=10μA (note 6) -25ºC≤TA≤+85ºC 40 90 pA/ºC Offset Current Change vs. VCB ΔIOS/ΔVCB 0 ≤ VCB ≤ VMAX (note 4) 30 70 pA/V Collector Saturation Voltage VCE(SAT) IC = 1mA, IB=100μA 0.05 0.1 V Output Capacitance COB VCB=15V, IE=0 23 pF Bulk Resistance rBE 10μA≤IC≤10mA (note6) 0.3 0.5 Ω Collector-Collector Capacitance CCC VCC = 0 35 pF Notes: 1. Current gain is guaranteed with Collector-Base Voltage (VCB) swept from 0 to VMAX at the indicated collector currents. 2. Current Gain Match (ΔhFE) defined as: ΔhFE = (100(ΔIB)( hFE min)/IC) 3. Noise Voltage Density is guaranteed, but not 100% tested 4. This is the maximum change in VOS as VCB is swept from 0V to 40V. 5. Measured at IC=10μA and guaranteed by design over the specified range of IC 6. Guaranteed by Design 7. ICC and ICES are verified by measurement of ICBO |
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