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CLP200M 数据表(PDF) 8 Page - STMicroelectronics

部件名 CLP200M
功能描述  OVERVOLTAGE AND OVERCURRENT PROTECTION FOR TELECOM LINE
PDF  21 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

CLP200M 数据表(HTML) 8 Page - STMicroelectronics

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CLP200M
8/21
AorB
B or A
E
15
25
0.2µF
50
20µF
4kv
ITEM
UNDER
TEST
A
B
E
15
25
0.2µF
50
20µF
ITEM
UNDER
TEST
25
4kv
TRANSVERSAL TEST
LONGITUDINAL TEST
Fig. 10 : Transversal and longitudinal test
topologies.
A
B
<10
ITEM
UNDER
TEST
<10
E
600
600
Fig. 12 : Power contact test circuit.
A
B
R1
ITEM
UNDER
TEST
R2
1µF
1µF
E
S2
S1
100
Fig. 11 : Power induction test circuit.
3. CLP200M TESTS RESULTS ACCORDING TO
CCITT K20 RECOMMENDATIONS
3.1 CCITT K20 Recommendations
In respect with the CCITT recommendations, the
CLP200M has to withstand three kinds of distur-
bances.
3.1.1. Lightning simulation
(Test 2, table 2/K20)
This test shall be done in transversal and longitudi-
nal modes as shown in figure 10.
The test generator is the 10/700
µs with 4kV of
peak voltage.
3.1.2. Power induction
(Test 3a and 3b, table 2/K20)
Two kinds of tests using the same circuit topology
(see fig.11) are defined in the CCITT K20.
s
Test 3a :
Vac(max) = 300VRMS,R1=R2=600
S2 operating and test duration = 200 ms.
s
Test 3b :
Vac(max) = 300VRMS (*), R1 = R2 = 200
S2 operating and test duration not defined.
(*) Recommended value.
3.1.3. Power contact (Test 3, table 1/K20)
This test shall be done with the test circuit of figure
12.
Vac(max) = 220VRMS , with switch S in each posi-
tion and duration 15 min.
3.1.4. Acceptance criteria and number of tests
For the tests described in chapter 3.1.1., 3.1.2. and
3.1.3. two criteria are defined :
A: Equipment shall withstand the test without dam-
age and shall operate properly within the specified
limits.
B: A fire hazard should not occur in the equipment
as a result of the tests.
The criteria are affected to the different tests as
mentioned in the table 1.



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