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CLP200M 数据表(PDF) 8 Page - STMicroelectronics |
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CLP200M 数据表(HTML) 8 Page - STMicroelectronics |
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8 / 21 page ![]() Obsolete Product(s) - Obsolete Product(s) CLP200M 8/21 AorB B or A E 15 25 0.2µF 50 20µF 4kv ITEM UNDER TEST A B E 15 25 0.2µF 50 20µF ITEM UNDER TEST 25 4kv TRANSVERSAL TEST LONGITUDINAL TEST Fig. 10 : Transversal and longitudinal test topologies. A B <10 ITEM UNDER TEST <10 E 600 600 Fig. 12 : Power contact test circuit. A B R1 ITEM UNDER TEST R2 1µF 1µF E S2 S1 100 Fig. 11 : Power induction test circuit. 3. CLP200M TESTS RESULTS ACCORDING TO CCITT K20 RECOMMENDATIONS 3.1 CCITT K20 Recommendations In respect with the CCITT recommendations, the CLP200M has to withstand three kinds of distur- bances. 3.1.1. Lightning simulation (Test 2, table 2/K20) This test shall be done in transversal and longitudi- nal modes as shown in figure 10. The test generator is the 10/700 µs with 4kV of peak voltage. 3.1.2. Power induction (Test 3a and 3b, table 2/K20) Two kinds of tests using the same circuit topology (see fig.11) are defined in the CCITT K20. s Test 3a : Vac(max) = 300VRMS,R1=R2=600 Ω S2 operating and test duration = 200 ms. s Test 3b : Vac(max) = 300VRMS (*), R1 = R2 = 200 Ω S2 operating and test duration not defined. (*) Recommended value. 3.1.3. Power contact (Test 3, table 1/K20) This test shall be done with the test circuit of figure 12. Vac(max) = 220VRMS , with switch S in each posi- tion and duration 15 min. 3.1.4. Acceptance criteria and number of tests For the tests described in chapter 3.1.1., 3.1.2. and 3.1.3. two criteria are defined : A: Equipment shall withstand the test without dam- age and shall operate properly within the specified limits. B: A fire hazard should not occur in the equipment as a result of the tests. The criteria are affected to the different tests as mentioned in the table 1. |
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