数据搜索系统,热门电子元器件搜索
  Chinese  ▼
ALLDATASHEETCN.COM

X  

ADP5033ACBZ-1-R7 数据表(PDF) 16 Page - Analog Devices

部件名 ADP5033ACBZ-1-R7
功能描述  Dual 3 MHz, 800 mA Buck Regulators with Two 300 mA LDOs
PDF  28 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
制造商  AD [Analog Devices]
网页  http://www.analog.com
标志 AD - Analog Devices

ADP5033ACBZ-1-R7 数据表(HTML) 16 Page - Analog Devices

Back Button ADP5033ACBZ-1-R7 Datasheet HTML 12Page - Analog Devices ADP5033ACBZ-1-R7 Datasheet HTML 13Page - Analog Devices ADP5033ACBZ-1-R7 Datasheet HTML 14Page - Analog Devices ADP5033ACBZ-1-R7 Datasheet HTML 15Page - Analog Devices ADP5033ACBZ-1-R7 Datasheet HTML 16Page - Analog Devices ADP5033ACBZ-1-R7 Datasheet HTML 17Page - Analog Devices ADP5033ACBZ-1-R7 Datasheet HTML 18Page - Analog Devices ADP5033ACBZ-1-R7 Datasheet HTML 19Page - Analog Devices ADP5033ACBZ-1-R7 Datasheet HTML 20Page - Analog Devices Next Button
Zoom Inzoom in Zoom Outzoom out
 16 / 28 page
background image
ADP5033
Rev. 0 | Page 16 of 28
witching losses are associated with the current drawn by the
(10)
whe
the P-MOSFET gate capacitance.
E-N
) is approxi-
osses occur because the P-channel power
he
T1
× (tRISE + tFALL) × fSW
(11)
whe
fall time of the
s of
d parameters are used for estimat-
Dissipation
ven by
)
(12)
whe
he load current of the LDO regulator.
e LDO,
all, and it
S
driver to turn on and turn off the power devices at the switching
frequency. The amount of switching power loss is given by
PSW = (CGATE-P + CGATE-N) × VIN12 × fSW
re:
CGATE-P is
CGATE-N is the N-MOSFET gate capacitance.
For the ADP5033, the total of (CGATE-P + CGAT
mately 150 pF.
The transition l
MOSFET cannot be turned on or off instantaneously, and t
SW node takes some time to slew from near ground to near
VOUT1 (and from VOUT1 to ground). The amount of transition
loss is calculated by
PTRAN = VIN1 × IOU
re tRISE and tFALL are the rise time and the
switching node, SW. For the ADP5033, the rise and fall time
SW are in the order of 5 ns.
If the preceding equations an
ing the converter efficiency, it must be noted that the equations
do not describe all of the converter losses, and the parameter
values given are typical numbers. The converter performance
also depends on the choice of passive components and board
layout; therefore, a sufficient safety margin should be included
in the estimate.
LDO Regulator Power
The power loss of a LDO regulator is gi
PDLDO = [(VIN − VOUT) × ILOAD] + (VIN × IGND
re:
ILOAD is t
VIN and VOUT are input and output voltages of th
respectively.
IGND is the ground current of the LDO regulator.
Power dissipation due to the ground current is sm
can be ignored.
JUNCTION TEMPERATURE
The total power dissipation in the ADP5033 simplifies to
PD = PDBUCK + PDLDO1 + PDLDO2
(13)
In cases where the board temperature TA is known, the thermal
resistance parameter, θJA, can be used to estimate the junction
temperature rise. TJ is calculated from TA and PD using the
formula
TJ = TA + (PD × θJA)
(14)
The typical θJA value for the 16-ball, 0.5 mm pitch WLCSP is
57°C/W (see Table 6). A very important factor to consider is
that θJA is based on a 4-layer 4 in × 3 in, 2.5 oz copper, as per
JEDEC standard, and real applications may use different sizes
and layers. It is important to maximize the copper used to remove
the heat from the device. Copper exposed to air dissipates heat
better than copper used in the inner layers. The exposed pad
should be connected to the ground plane with several vias.
If the case temperature can be measured, the junction tempera-
ture is calculated by
TJ = TC + (PD × ΨJB)
(15)
where TC is the case temperature and ΨJB is the junction-to-
board thermal resistance provided in Table 6.
When designing an application for a particular ambient
temperature range, calculate the expected ADP5033 power
dissipation (PD) due to the losses of all channels by using the
Equation 8 to Equation 13. From this power calculation, the
junction temperature, TJ, can be estimated using Equation 14.
The reliable operation of the converter and the two LDO regulators
can be achieved only if the estimated die junction temperature of
the ADP5033 (Equation 14) is less than 125°C. Reliability and
mean time between failures (MTBF) is highly affected by increas-
ing the junction temperature. Additional information about
product reliability can be found in the ADI Reliability Handbook,
which can be found at www.analog.com/reliability_handbook.



Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28


数据表 下载

Go To PDF Page


链接网址



ALLDATASHEET是否为您带来帮助?  [ DONATE ] 

关于 Alldatasheet   |   广告服务   |   联系我们   |   隐私政策   |   数据表链接    |   链接交换   |   制造商名单
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com