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HT45B0F 数据表(PDF) 4 Page - Holtek Semiconductor Inc |
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HT45B0F 数据表(HTML) 4 Page - Holtek Semiconductor Inc |
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4 / 23 page  A.C. Characteristics Ta=25 °C Symbol Parameter Test Conditions Min. Typ. Max. Unit VDD Conditions VDD Slew Rate for POR ¾¾ 0.0034 ¾¾ V/ms fCLKI System Clock (External Clock Input) 2.0V ¾ 400 ¾ 12000 kHz 2.7V ¾ 400 ¾ 16000 kHz 5.0V ¾ 400 ¾ 20000 kHz tCP SCK Period (tCH +tCL) 2.0V ¾ 83.3 ¾¾ ns 2.7V ¾ 62.5 ¾¾ ns 3.0V ¾ 62.5 ¾¾ ns 5.0V ¾ 50.0 ¾¾ ns tCH SCK High Time 2.0V ¾ 37 ¾¾ ns 2.7V ¾ 28 ¾¾ ns 3.0V ¾ 28 ¾¾ ns 5.0V ¾ 22 ¾¾ ns tCL SCK Low Time 2.0V ¾ 37 ¾¾ ns 2.7V ¾ 28 ¾¾ ns 3.0V ¾ 28 ¾¾ ns 5.0V ¾ 22 ¾¾ ns tCSW SCS High Pulse Width 2.0V ¾ 667 ¾¾ ns 2.7V ¾ 500 ¾¾ ns 3.0V ¾ 500 ¾¾ ns 5.0V ¾ 400 ¾¾ ns tCSS SCS to SCK Setup Time ¾¾ 100 ¾¾ ns tCSH SCS to SCK Hold Time ¾¾ 0 ¾¾ ns tSDS SDI to SCK Setup Time ¾¾ 100 ¾¾ ns tSDH SDI to SCK Hold Time ¾¾ 0 ¾¾ ns tR SPI Output Rise Time ¾¾ ¾ 10 ¾ ns tF SPI Output Fall Time ¾¾ ¾ 10 ¾ ns tW SPI Data Output Delay Time ¾¾ 0 ¾¾ ns HT45B0F Rev. 1.00 4 June 7, 2011 |
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