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ADE7757 数据表(PDF) 3 Page - Analog Devices |
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ADE7757 数据表(HTML) 3 Page - Analog Devices |
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3 / 14 page ![]() PRELIMINARY TECHNICAL DATA REV. PrC. –3– ADE7757 .t2 .t3 t4 .t5 .t6 t1 F1 F2 CF TIMING CHARACTERISTICS 1, 2 Parameter A, B Versions Units Test Conditions/Comments t1 3 550 ms F1 and F2 Pulsewidth (Logic Low) t2 See Table II sec Output Pulse Period. See Transfer Function Section t3 1/2 t2 sec Time Between F1 Falling Edge and F2 Falling Edge t4 3, 4 180 ms CF Pulsewidth (Logic High) t5 See Table III sec CF Pulse Period. See Transfer Function Section t6 T B D sec Minimum Time Between F1 and F2 Pulse NOTES 1Sample tested during initial release and after any redesign or process change that may affect this parameter. 2See Figure 1. 3The pulsewidths of F1, F2 and CF are not fixed for higher output frequencies. See Frequency Outputs Section. 4The CF pulse is always 18 µs in the high frequency mode. See Frequency Outputs section and Table III. Specifications subject to change without notice. ORDERING GUIDE Model Package Description Package Options ADE7757ARN SOIC narrow-body RN-16 EVAL-ADE7757EB Evaluation Board Evaluation Board Figure 1. Timing Diagram for Frequency Outputs (VDD = 5 V 5%, AGND = DGND = 0 V, On-Chip Reference, rCKLIN = 5 k Ω 0.1% 5ppm/°C, TMIN to TMAX = –40 C to +85 C) |
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