ADP1051

Preliminary Technical Data

Rev. PrA | Page 6 of 17

Parameter

Symbol

Test Conditions/Comments

Min

Typ

Max

Unit

−4.8

+7.2

mV

From 0% to 100% of valid input voltage

−2.6

+1.6

% FSR

OTP

Threshold Accuracy

T = 85°C with 100 kΩ||16.5 kΩ

−0.9

+0.25

% FSR

−14.4

+4

mV

T = 100°C with 100 kΩ||16.5 kΩ

-0.5

+1.1

% FSR

-8

+17.6

mV

Comparator Speed

10

ms

Temperature Readings According

to Internal Linearization Scheme

Factory trimmed to 46 µA (set Register

T = 25°C to 100°C

7

°C

T = 100°C to 125°C

5

°C

PG/ALT# (OPEN DRAIN) PIN

Output Low Level

Sinking Current = 10 mA

0.4

V

CTRL, SYNI/FLGI PINS

Input Low Level

Sinking Current = 10 mA

0.4

V

Input High Level

V

SDA/SCL PINS

Input Voltage Low

0.8

V

Input Voltage High

V

Output Voltage Low

0.4

V

Leakage Current

−5

+5

µA

SERIAL BUS TIMING

Clock Frequency

100

400

kHz

Glitch Immunity

50

ns

Bus Free Time

4.7

µs

Start Setup Time

4.7

µs

Start Hold Time

4

µs

SCL Low Time

4.7

µs

SCL High Time

4

µs

SCL, SDA Rise Time

1000

ns

SCL, SDA Fall Time

300

ns

Data Setup Time

250

ns

Data Hold Time

300

ns

EEPROM

EEPROM Update Time

Time from the updating command to

40

ms

Reliability

10,000

Cycles

1,000

Cycles

20

Years

10

Years

1

Endurance is qualified as per JEDEC Standard 22 Method A117 and measured at −40°C, +25°C, +85°C, and +125°C.

2