AM29F040 datasheet(21/33 Pages) AMD

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Am29F040

AC CHARACTERISTICS

Read Only Operations Characteristics

Notes:

Test Conditions (for -55):

Output Load: 1 TTL gate and 30 pF

Input rise and fall times: 5 ns

Input pulse levels: 0.0 V to 3.0 V

Timing measurement reference level, input and output: 1.5 V and 1.5 V

(for all others):

Output Load: 1 TTL gate and 100 pF

Input rise and fall times: 20 ns

Input pulse levels: 0.45 V to 2.4 V

Timing measurement reference level, input and output: 0.8 V and 2.0 V

2. Output driver disable time.

3. Not 100% tested.

Parameter Symbols

Description

Test Setup

Speed Options (Note 1)

Unit

JEDEC

Standard

-55

-70

-90

-120

-150

tAVAV

tRC

Read Cycle Time (Note 3)

Min

120

150

tAVQV

tACC

Address to Output Delay

CE = VIL

OE = VIL

Max

120

150

tELQV

tCE

Chip Enable to Output Delay

OE = VIL Max

120

150

tGLQV

tOE

Output Enable to Output Delay

Max

tEHQZ

tDF

Chip Enable to Output High Z

(Notes 2, 3)

Max

tGHQZ

tDF

Output Enable to Output

High Z (Notes 2, 3)

tAXQX

tOH

Output Hold Time from

Addresses, CE or OE,

Whichever Occurs First

Min

00000

2.7 k

Ω

Diodes = IN3064

or Equivalent

6.2 k

Ω

5.0 V

IN3064

or Equivalent

Device

Under

Test

17113E-13

Notes:

For –55: CL = 30 pF including jig capacitance

For all others: CL = 100 pF including jig capacitance

Figure 8.

Test Conditions

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