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AN4253 数据表(PDF) 13 Page - STMicroelectronics

部件名 AN4253
功能描述  SPC564Lx device startup flow
PDF  44 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

AN4253 数据表(HTML) 13 Page - STMicroelectronics

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AN4253
FCCU block
4.2.1
Code sequence
Reading Critical Faults (CF)
1.
Write command OPR=9 to FCCU_CTRL register
2.
Wait for operation to finish (FCCU.CTRL.OPS = SUCCESS)
3.
Read the FCCU_CF register
Reading Non-Critical Faults (NCF)
1.
Write command OPR=9 to FCCU_CTRL register
2.
Wait for operation to finish (FCCU.CTRL.OPS = SUCCESS)
3.
Read the FCCU_NCF register
4.3
Analyze FCCU faults
In most cases this block will be skipped unless application requires special startup code for
different faults.
4.4
STCU fault analysis
This analysis is recommended as any issue found during the built-in self test can signal a
presence of latent faults.
There are three signals routed from STCU to FCCU unit to report different kind of issues:
It is recommended to monitor all three fault signals and take an appropriate action when any
STCU fault is active.
4.4.1
Code sequence
1.
Test bits b’20 and b’27 in Critical faults
2.
Test bit b’12 in Non-critical faults
3.
If any of the testing bits is ‘1’ > Jump to FCCU Fault handler
Otherwise continue in startup
4.5
Save FCCU faults
It is usually required to keep fault values for later analysis by the application code. This
cannot be done by simply leaving status registers untouched and read them later. The
reason is that any present fault in FCCU status register would prevent successful transition
from SAFE mode to DRUN mode.
CF[20]
Critical fault found by xBIST test
CF[27]
STCU fault of starting the xBIST tests during the runtime, which leads
to content corruption in the RAM array or in the digital logic
NCF[12]
Non-critical fault found by xBIST test



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