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A6986F 数据表(PDF) 67 Page - STMicroelectronics |
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A6986F 数据表(HTML) 67 Page - STMicroelectronics |
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67 / 72 page ![]() DocID027739 Rev 1 67/72 A6986F EMC testing results 72 Figure 63. CE 150R at RST test point (see Figure 58) at 80% ILOAD Figure 64. CE 150R at RST test point (see Figure 58) at 10% ILOAD Test results (continue): Test case CE #7 - Emission RST/ Iload_VOUT = 1.2A -20 -10 0 10 20 30 40 50 60 70 80 90 100 0,1 1 10 100 1000 Limit BISS class II local / 8-H (PK) Limit BISS class III local / 10-K (PK) PK - RST AV - RST [MHz] [dBµV] CE - 150 Ohm method - Local Pins DUT: Mode: Iload_Vout = 1.2A Test case: Emission RST A6986F5V A6986F5V Test case CE #8 - Emission RST/ Iload_VOUT = 150mA -20 -10 0 10 20 30 40 50 60 70 80 90 100 0,1 1 10 100 1000 Limit BISS class II local / 8-H (PK) Limit BISS class III local / 10-K (PK) PK - RST AV - RST [MHz] [dBµV] CE - 150 Ohm method - Local Pins DUT: Mode: Iload_Vout = 150mA Test case: Emission RST A6986F5V A6986F5V |
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