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LP8556 数据表(PDF) 6 Page - Texas Instruments |
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LP8556 数据表(HTML) 6 Page - Texas Instruments |
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6 / 63 page ![]() 6 LP8556 SNVS871I – JULY 2012 – REVISED MARCH 2016 www.ti.com Product Folder Links: LP8556 Submit Documentation Feedback Copyright © 2012–2016, Texas Instruments Incorporated (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability, see the Electrical Characteristics tables. (2) If Military/Aerospace specified devices are required, contact the Texas Instruments Sales Office/ Distributors for availability and specifications. (3) In applications where high power dissipation and/or poor package thermal resistance is present, the maximum ambient temperature may have to be de-rated. Maximum ambient temperature (TA-MAX) is dependent on the maximum operating junction temperature (TJ-MAX-OP = 125°C), the maximum power dissipation of the device in the application (PD-MAX), and the junction-to ambient thermal resistance of the part/package in the application (RθJA), as given by the following equation: TA-MAX = TJ-MAX-OP – (RθJA × PD-MAX). 7 Specifications 7.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) (2) MIN MAX UNIT VDD –0.3 24 V Voltage on Logic Pins (SCL, SDA, PWM) –0.3 6 Voltage on Analog Pins (VLDO, EN / VDDIO) –0.3 6 Voltage on Analog Pins (FSET, ISET) –0.3 VLDO + 0.3 V (LED1...LED6, SW, VBOOST) –0.3 50 Junction Temperature (TJ-MAX) (3) 125 °C Maximum Lead Temperature (Soldering) 260 °C Storage temperature, Tstg –65 150 °C (1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. (2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 7.2 ESD Ratings VALUE UNIT V(ESD) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) ±2000 V Charged-device model (CDM), per JEDEC specification JESD22-C101(2) ±500 (1) All voltages are with respect to the potential at the GND pins. 7.3 Recommended Operating Conditions over operating free-air temperature range (unless otherwise noted) (1) MIN MAX UNIT VDD 2.7 20 V EN / VDDIO 1.62 3.6 V V (LED1...LED6, SW, VBOOST) 0 48 V Junction temperature, TJ –30 125 °C Ambient temperature, TA –30 85 °C (1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report (SPRA953). 7.4 Thermal Information THERMAL METRIC(1) LP8556 UNIT YFQ (DSBGA) RTW (WQFN) 20 PINS 24 PINS RθJA Junction-to-ambient thermal resistance 66.2 35.0 °C/W RθJC(top) Junction-to-case (top) thermal resistance 0.5 32.2 °C/W RθJB Junction-to-board thermal resistance 15.1 13.7 °C/W ψJT Junction-to-top characterization parameter 1.9 0.3 °C/W ψJB Junction-to-board characterization parameter 15.0 13.8 °C/W RθJC(bot) Junction-to-case (bottom) thermal resistance n/a 3.3 °C/W |
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