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M25P16 数据表(PDF) 32 Page - STMicroelectronics |
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M25P16 数据表(HTML) 32 Page - STMicroelectronics |
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32 / 39 page ![]() M25P16 32/39 Note: 1. tCH + tCL must be greater than or equal to 1/ fC 2. Value guaranteed by characterization, not 100% tested in production. 3. Expressed as a slew-rate. 4. Only applicable as a constraint for a WRSR instruction when SRWD is set at 1. tSHQZ 2 tDIS Output Disable Time 8 ns tCLQV tV Clock Low to Output Valid 8 ns tCLQX tHO Output Hold Time 0 ns tHLCH HOLD Setup Time (relative to C) 5 ns tCHHH HOLD Hold Time (relative to C) 5 ns tHHCH HOLD Setup Time (relative to C) 5 ns tCHHL HOLD Hold Time (relative to C) 5 ns tHHQX 2 tLZ HOLD to Output Low-Z 8 ns tHLQZ 2 tHZ HOLD to Output High-Z 8 ns tWHSL 4 Write Protect Setup Time 20 ns tSHWL 4 Write Protect Hold Time 100 ns tDP 2 S High to Deep Power-down Mode 3 µs tRES1 2 S High to Standby Mode without Electronic Signature Read 30 µs tRES2 2 S High to Standby Mode with Electronic Signature Read 30 µs tW Write Status Register Cycle Time 5 15 ms tPP Page Program Cycle Time 1.4 5 ms tSE Sector Erase Cycle Time 1 3 s tBE Bulk Erase Cycle Time 17 40 s Test conditions specified in Table 10. and Table 11. Symbol Alt. Parameter Min. Typ. Max. Unit |
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