ZSC31015EEG1-R datasheet(48/52 Pages) IDT

48 / 52 page

November 14, 2016

ZSC31015 Datasheet

ESD/Latch-Up-Protection

All pins have an ESD protection of >4000V and a latch-up protection of

100 mA or of +8V/ –4V (to VSS/VSSA).

ESD protection referenced to the Human Body Model is tested with devices in SOP-8 packages during product

qualification. The ESD test follows the Human Body Model with 1.5k

Ω/100pF based on MIL 883, Method 3015.7.

Test

The test program is based on this datasheet. The final parameters that are tested during series production are

listed in the tables of section 1.

The digital part of the IC includes a scan path, which can be activated and controlled during wafer test. Further

test support for testing of the analog parts on wafer level is included in the DSP.

Quality and Reliability

A reliability investigation according to the in-house non-automotive standard has been performed.

Customization

For high-volume applications, which require an upgraded or downgraded functionality compared to the

ZSC31015, IDT can customize the circuit design by adding or removing certain functional blocks.

For this customization, IDT has a considerable library of sensor-dedicated circuitry blocks, which enable IDT to

provide a custom solution quickly. Please contact IDT for further information.

ZSC31015EEG1-R 数据表(PDF) 48 Page - Integrated Device Technology