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ADL5506ACBZ-R7 数据表(PDF) 22 Page - Analog Devices |
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ADL5506ACBZ-R7 数据表(HTML) 22 Page - Analog Devices |
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22 / 24 page ![]() Data Sheet ADL5506 Rev. A | Page 21 of 23 VLOG Output Noise The ADL5506 VLOG output noise is shown in Figure 31 in the Typical Performance Characteristics section for Capacitor CFLT = open. Placing capacitance from CFLT to VLOG decreases the noise spectral density and the integrated noise. The choice of the CFLT value depends on the requirements pertaining to integrated noise and noise spectral density at a given frequency. Also, the value of CFLT directly controls the video bandwidth of the output, and thus controls the output response time to an RF pulse (see the VLOG Pulse Response Time section). VLOG Pulse Response Time The ADL5506 VLOG output response for rise and fall times to a given RF input pulse is quickest for CFLT = open; that is, the only capacitance on the CFLT node is the internal capacitor. Adding off-chip capacitance from the CFLT pin to the VLOG pin decreases the video bandwidth and slows the output response to an RF input pulse. See the Filter Capacitor section for an approximate closed form equation for the VLOG video bandwidth. Figure 28 shows the response time when the ENBL pin is pulsed while having the VPOS pin connect to a 3.0 V supply and an RF signal applied at RFIN. The sharp pulse that is seen on VLOG preceding the actual response of the detectors, which happens approximately 0.5 µs later, is the power-up transient that occurs in the output stage. The upper voltage limit of these power-up transients is 2.25 V typical, for a 3.0 V supply. Ensure that these power-up transients do not overload the circuit that the VLOG pin drives. Device Handling The wafer level chip scale package consists of solder bumps connected to the active side of the die. The device is lead-free with 95.5% tin, 4.0% silver, and 0.5% copper solder bump composition. The WLCSP package can be mounted on printed circuit boards using standard surface-mount assembly techniques; however, take caution to avoid damaging the die. See the AN-617 Application Note for additional information. WLCSP devices are bumped die, and exposed die can be sensitive to light conditions, which can influence specified limits. |
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