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L9301 数据表(PDF) 25 Page - STMicroelectronics |
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L9301 数据表(HTML) 25 Page - STMicroelectronics |
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25 / 51 page ![]() DocID028688 Rev 6 25/51 L9301 Configurable high/low side driver 50 8.2.7 Over current (OC) comparator self-test L9301 provides driver OC (over current) comparator self-test function. During OFF phase, the OC comparator still works and the expected result is '1' due to high drain-source voltage. If L9301 detects OC '0' during OFF phase, the SPI bit oc_comparator_f is set to '1'. For DRN1-4, when they are configured as LS, a Short To Ground (STG) fault will not trigger OC '1', so L9301 will report both STG and OC comparator self-test fail, when they are configured as HS, a short-to-battery (STB) fault will not trigger OC '1', so L9301 will report both STB and OC comparator self-test fail. 8.2.8 Electrical characteristics related to diagnosis Table 17. Electrical characteristics related to diagnosis Pin Symbol Parameter Test condition Min. Typ. Max. Unit DRN1-4 SRC1-4 TOver_temperature_blanking Over temperature blanking time Tested by scan 1 - 1.5 μs TOver_temperature_filter Over temperature filter time Tested by scan 2 - 5 μs TCharge_pump_low Charge pump low filter time Tested by scan 3 - 5 μs TCharge_pump_low_blanking Charge pump low blanking time Tested by scan 25 - 40 μs Tdiode_loss_filter_time Diode loss filter time Tested by scan 3 - 5 μs Ropen_load_HLS Min. resistor value open load detection Not tested 10 - kΩ IOC_HLS Over current threshold 1 -1 2 3 A IOC_HLS Over current threshold 2 -3 4 5 A TFLT_OC_HLS Over current filtering time Tested by scan 3 - 5 μs TFLT_diagoff_HLS Filtering open load and short to GND diag. off Tested by scan 55 - 80 μs Td_blank0_HLS Diagnosis blanking time after switch-off Tested by scan 900 - 1300 μs Td_blank1_HLS Diagnosis blanking time after switch-off Tested by scan 450 - 650 μs VTOPEN_HS Open load threshold voltage HS configuration 1.9 2.1 2.3 V VTOPEN_LS LS configuration 2.7 2.9 3.1 V |
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